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Dive into the research topics where Sunil Rathore is active. These topic labels come from the works of this person. Together they form a unique fingerprint.
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A Novel Latch Reset Technique Enabling Sub- 6 μ ~W Operation in Double-Tail Comparator
Dubey, A., Rathore, S. & Bagga, N., 2026, Proceedings - 2026 39th International Conference on VLSI Design and 25th International Conference on Embedded Systems, VLSID 2026. Institute of Electrical and Electronics Engineers Inc., p. 443-448 6 p. (Proceedings - 2026 39th International Conference on VLSI Design and 25th International Conference on Embedded Systems, VLSID 2026).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
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Demonstrating the Electro-Thermal Dynamics in Complementary FETs: Quantifying the Role of Self-Heating and Grain Effect Intercoupling
Kumar, S., Patil, D. H., Rathore, S., Dasgupta, S. & Bagga, N., 2026, (Accepted/In press) In: IEEE Transactions on Electron Devices. 73, 4, p. 2415-2421 7 p.Research output: Contribution to journal › Article › peer-review
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On the Reliability of Complementary Field Effect Transistor: Unveiling the Role of Grain Granularities and Random Fluctuations
Kumar, S., Pati, D. H., Rathore, S., Dixit, A., Kumar, N., Georgiev, V., Dasgupta, S. & Bagga, N., 2026, (Accepted/In press) In: IEEE Transactions on Device and Materials Reliability. 26, 1, p. 365-371 7 p.Research output: Contribution to journal › Article › peer-review
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A Novel De-Mirroring Approach for Bias-dependent Capacitance Extraction in Nanosheet FET using Conformal Mapping
Patil, D. H., Kumar, S., Rathore, S., Dasgupta, S. & Bagga, N., 2025, 9th IEEE Electron Devices Technology and Manufacturing Conference: Shaping the Future with Innovations in Devices and Manufacturing, EDTM 2025. Institute of Electrical and Electronics Engineers Inc., (9th IEEE Electron Devices Technology and Manufacturing Conference: Shaping the Future with Innovations in Devices and Manufacturing, EDTM 2025).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
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A Novel De-Mirroring-based Analytical Model for Capacitance Extraction of Nanosheet FET using Dielectric Permittivity Suppression
Patil, D. H., Kumar, S., Rathore, S., Dasgupta, S. & Bagga, N., 2025, (Accepted/In press) In: IEEE Transactions on Dielectrics and Electrical Insulation.Research output: Contribution to journal › Article › peer-review
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