TY - GEN
T1 - A Microwave Sensor for Grain Moisture-Content Measurement Designed with Surface Wave Transmission Line
AU - Yadav, Swati Varun
AU - Chittora, Ashish
N1 - Publisher Copyright:
© 2023 IEEE.
PY - 2023
Y1 - 2023
N2 - In this paper, a novel microwave sensor is presented to determine the moisture content (MC) of grains. The sensor is designed with microstrip surface wave launcher at 2.72 GHz and a single conductor transmission line. The grain sample is placed in a container between the launchers mounted on the conductor line. The experiments are performed with wheat samples of MC varying from 10% to 25%. Variation of S21-parameter (transmission coefficient) with MC at 2.72 GHz is recorded to be from -20.6dB to -45.2dB respectively, i.e., 1.64 dB attenuation per unit percentage MC value. The proposed sensor is compact, portable and can be used to accurately measure MC of the test samples in the field with the sensor and a portable VNA.
AB - In this paper, a novel microwave sensor is presented to determine the moisture content (MC) of grains. The sensor is designed with microstrip surface wave launcher at 2.72 GHz and a single conductor transmission line. The grain sample is placed in a container between the launchers mounted on the conductor line. The experiments are performed with wheat samples of MC varying from 10% to 25%. Variation of S21-parameter (transmission coefficient) with MC at 2.72 GHz is recorded to be from -20.6dB to -45.2dB respectively, i.e., 1.64 dB attenuation per unit percentage MC value. The proposed sensor is compact, portable and can be used to accurately measure MC of the test samples in the field with the sensor and a portable VNA.
UR - https://www.scopus.com/pages/publications/85158023979
UR - https://www.scopus.com/pages/publications/85158023979#tab=citedBy
U2 - 10.1109/APSCON56343.2023.10101067
DO - 10.1109/APSCON56343.2023.10101067
M3 - Conference contribution
AN - SCOPUS:85158023979
T3 - APSCON 2023 - IEEE Applied Sensing Conference, Symposium Proceedings
BT - APSCON 2023 - IEEE Applied Sensing Conference, Symposium Proceedings
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2023 IEEE Applied Sensing Conference, APSCON 2023
Y2 - 23 January 2023 through 25 January 2023
ER -