A study of microstructural properties and quantum size effect in SILAR deposited nano-crystalline CdS thin films

V. K. Ashith; K. Gowrish Rao

doi:10.1016/j.tsf.2016.08.024

A study of microstructural properties and quantum size effect in SILAR deposited nano-crystalline CdS thin films

V. K. Ashith
, K. Gowrish Rao^*

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

16 Citations (Scopus)

Abstract

The paper reports deposition and characterization of CdS thin films by micro-controlled SILAR technique using CdCl₂ and Na₂S as precursors. The thickness of the films was found to increase with number of immersion cycles, and also with the concentration of precursor solutions. But this increase in thickness was observed only up to a certain limit beyond which films showed peeling effect. The films were found to be polycrystalline with cubic structure. The lattice constant, crystallite size and average strain on the films were found from detailed XRD analysis. Optical characterization revealed that the films exhibit quantum size effect due to their nano crystalline nature.

Original language	English
Pages (from-to)	197-203
Number of pages	7
Journal	Thin Solid Films
Volume	616
DOIs	https://doi.org/10.1016/j.tsf.2016.08.024
Publication status	Published - 01-10-2016

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Surfaces and Interfaces
Surfaces, Coatings and Films
Metals and Alloys
Materials Chemistry

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10.1016/j.tsf.2016.08.024

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title = "A study of microstructural properties and quantum size effect in SILAR deposited nano-crystalline CdS thin films",

abstract = "The paper reports deposition and characterization of CdS thin films by micro-controlled SILAR technique using CdCl2 and Na2S as precursors. The thickness of the films was found to increase with number of immersion cycles, and also with the concentration of precursor solutions. But this increase in thickness was observed only up to a certain limit beyond which films showed peeling effect. The films were found to be polycrystalline with cubic structure. The lattice constant, crystallite size and average strain on the films were found from detailed XRD analysis. Optical characterization revealed that the films exhibit quantum size effect due to their nano crystalline nature.",

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AU - Ashith, V. K.

AU - Rao, K. Gowrish

PY - 2016/10/1

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N2 - The paper reports deposition and characterization of CdS thin films by micro-controlled SILAR technique using CdCl2 and Na2S as precursors. The thickness of the films was found to increase with number of immersion cycles, and also with the concentration of precursor solutions. But this increase in thickness was observed only up to a certain limit beyond which films showed peeling effect. The films were found to be polycrystalline with cubic structure. The lattice constant, crystallite size and average strain on the films were found from detailed XRD analysis. Optical characterization revealed that the films exhibit quantum size effect due to their nano crystalline nature.

AB - The paper reports deposition and characterization of CdS thin films by micro-controlled SILAR technique using CdCl2 and Na2S as precursors. The thickness of the films was found to increase with number of immersion cycles, and also with the concentration of precursor solutions. But this increase in thickness was observed only up to a certain limit beyond which films showed peeling effect. The films were found to be polycrystalline with cubic structure. The lattice constant, crystallite size and average strain on the films were found from detailed XRD analysis. Optical characterization revealed that the films exhibit quantum size effect due to their nano crystalline nature.

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UR - https://www.scopus.com/pages/publications/84982227865#tab=citedBy

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DO - 10.1016/j.tsf.2016.08.024

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SN - 0040-6090

VL - 616

SP - 197

EP - 203

JO - Thin Solid Films

JF - Thin Solid Films

ER -

A study of microstructural properties and quantum size effect in SILAR deposited nano-crystalline CdS thin films

Abstract

All Science Journal Classification (ASJC) codes

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