A study on the microstructural parameters of 550 keV electron irradiated lexan polymer films

K. Hareesh; R. Pramod; V. C. Petwal; Jishnu Dwivedi; Sangappa; Ganesh Sanjeev

doi:10.1063/1.4710139

A study on the microstructural parameters of 550 keV electron irradiated lexan polymer films

K. Hareesh^*, R. Pramod, V. C. Petwal, Jishnu Dwivedi, Sangappa, Ganesh Sanjeev

^*Corresponding author for this work

Department of Physics, Manipal Institute of Technology, Bengaluru

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

Lexan polymer films irradiated with 550 keV Electron Beam (EB) were characterized using Wide Angle Xray Scattering (WAXS) data to study the microstructural parameters. The crystal imperfection parameters like crystal size <N>, lattice strain (g in %) and enthalpy (α) have been determined by Line Profile Analysis (LPA) using Fourier method of Warren.

Original language	English
Title of host publication	Solid State Physics - Proceedings of the 56th DAE Solid State Physics Symposium 2011
Pages	585-586
Number of pages	2
Edition	1
DOIs	https://doi.org/10.1063/1.4710139
Publication status	Published - 2012
Event	56th DAE Solid State Physics Symposium 2011 - Kattankulathur, Tamilnadu, India Duration: 19-12-2011 → 23-12-2011

Publication series

Name	AIP Conference Proceedings
Number	1
Volume	1447
ISSN (Print)	0094-243X
ISSN (Electronic)	1551-7616

Conference

Conference	56th DAE Solid State Physics Symposium 2011
Country/Territory	India
City	Kattankulathur, Tamilnadu
Period	19-12-11 → 23-12-11

All Science Journal Classification (ASJC) codes

General Physics and Astronomy

Access to Document

10.1063/1.4710139

Cite this

Hareesh, K., Pramod, R., Petwal, V. C., Dwivedi, J., Sangappa, & Sanjeev, G. (2012). A study on the microstructural parameters of 550 keV electron irradiated lexan polymer films. In Solid State Physics - Proceedings of the 56th DAE Solid State Physics Symposium 2011 (1 ed., pp. 585-586). (AIP Conference Proceedings; Vol. 1447, No. 1). https://doi.org/10.1063/1.4710139

@inproceedings{0926e4a6cbb24e2d9b14fa622b4e7409,

title = "A study on the microstructural parameters of 550 keV electron irradiated lexan polymer films",

abstract = "Lexan polymer films irradiated with 550 keV Electron Beam (EB) were characterized using Wide Angle Xray Scattering (WAXS) data to study the microstructural parameters. The crystal imperfection parameters like crystal size , lattice strain (g in \%) and enthalpy (α) have been determined by Line Profile Analysis (LPA) using Fourier method of Warren.",

author = "K. Hareesh and R. Pramod and Petwal, \{V. C.\} and Jishnu Dwivedi and Sangappa and Ganesh Sanjeev",

year = "2012",

doi = "10.1063/1.4710139",

language = "English",

isbn = "9780735410442",

series = "AIP Conference Proceedings",

number = "1",

pages = "585--586",

booktitle = "Solid State Physics - Proceedings of the 56th DAE Solid State Physics Symposium 2011",

edition = "1",

note = "56th DAE Solid State Physics Symposium 2011 ; Conference date: 19-12-2011 Through 23-12-2011",

}

Hareesh, K, Pramod, R, Petwal, VC, Dwivedi, J, Sangappa & Sanjeev, G 2012, A study on the microstructural parameters of 550 keV electron irradiated lexan polymer films. in Solid State Physics - Proceedings of the 56th DAE Solid State Physics Symposium 2011. 1 edn, AIP Conference Proceedings, no. 1, vol. 1447, pp. 585-586, 56th DAE Solid State Physics Symposium 2011, Kattankulathur, Tamilnadu, India, 19-12-11. https://doi.org/10.1063/1.4710139

A study on the microstructural parameters of 550 keV electron irradiated lexan polymer films. / Hareesh, K.; Pramod, R.; Petwal, V. C. et al.
Solid State Physics - Proceedings of the 56th DAE Solid State Physics Symposium 2011. 1. ed. 2012. p. 585-586 (AIP Conference Proceedings; Vol. 1447, No. 1).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

TY - GEN

T1 - A study on the microstructural parameters of 550 keV electron irradiated lexan polymer films

AU - Hareesh, K.

AU - Pramod, R.

AU - Petwal, V. C.

AU - Dwivedi, Jishnu

AU - Sangappa,

AU - Sanjeev, Ganesh

PY - 2012

Y1 - 2012

N2 - Lexan polymer films irradiated with 550 keV Electron Beam (EB) were characterized using Wide Angle Xray Scattering (WAXS) data to study the microstructural parameters. The crystal imperfection parameters like crystal size , lattice strain (g in %) and enthalpy (α) have been determined by Line Profile Analysis (LPA) using Fourier method of Warren.

AB - Lexan polymer films irradiated with 550 keV Electron Beam (EB) were characterized using Wide Angle Xray Scattering (WAXS) data to study the microstructural parameters. The crystal imperfection parameters like crystal size , lattice strain (g in %) and enthalpy (α) have been determined by Line Profile Analysis (LPA) using Fourier method of Warren.

UR - https://www.scopus.com/pages/publications/84876804781

UR - https://www.scopus.com/inward/citedby.url?scp=84876804781&partnerID=8YFLogxK

U2 - 10.1063/1.4710139

DO - 10.1063/1.4710139

M3 - Conference contribution

AN - SCOPUS:84876804781

SN - 9780735410442

T3 - AIP Conference Proceedings

SP - 585

EP - 586

BT - Solid State Physics - Proceedings of the 56th DAE Solid State Physics Symposium 2011

T2 - 56th DAE Solid State Physics Symposium 2011

Y2 - 19 December 2011 through 23 December 2011

ER -

A study on the microstructural parameters of 550 keV electron irradiated lexan polymer films

Abstract

Publication series

Conference

All Science Journal Classification (ASJC) codes

Access to Document

Other files and links

Fingerprint

Cite this