TY - GEN
T1 - A Study to Detect Emotions from Twitter Text Using Machine Learning Algorithms
AU - Anusha,
AU - Shenoy, Savitha A.
AU - Harish, S. V.
N1 - Publisher Copyright:
© 2023 IEEE.
PY - 2023
Y1 - 2023
N2 - One of the main factor contributing to mental illness, which has been linked to an increased risk of dying young is depression. Additionally, it significantly contributes to suicide ideation. Although there are many underlying reasons of depression, social networking sites play a key part in raising the likelihood of depression. In recent years social media has become the integral part of our daily lives. User reflects his internal life in the content he shares in his social media platform like twitter. People share happy incidents, joyful memories and sad moments through tweets. Thus it is possible to forecast depression in people using Twitter data. Various machine learning techniques have been employed to analyze these data. The algorithms employed are Naïve Bayes and Logistic Regression. Those algorithms will produce intended outcomes.
AB - One of the main factor contributing to mental illness, which has been linked to an increased risk of dying young is depression. Additionally, it significantly contributes to suicide ideation. Although there are many underlying reasons of depression, social networking sites play a key part in raising the likelihood of depression. In recent years social media has become the integral part of our daily lives. User reflects his internal life in the content he shares in his social media platform like twitter. People share happy incidents, joyful memories and sad moments through tweets. Thus it is possible to forecast depression in people using Twitter data. Various machine learning techniques have been employed to analyze these data. The algorithms employed are Naïve Bayes and Logistic Regression. Those algorithms will produce intended outcomes.
UR - https://www.scopus.com/pages/publications/85158055397
UR - https://www.scopus.com/inward/citedby.url?scp=85158055397&partnerID=8YFLogxK
U2 - 10.1109/INOCON57975.2023.10101258
DO - 10.1109/INOCON57975.2023.10101258
M3 - Conference contribution
AN - SCOPUS:85158055397
T3 - 2023 2nd International Conference for Innovation in Technology, INOCON 2023
BT - 2023 2nd International Conference for Innovation in Technology, INOCON 2023
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2nd International Conference for Innovation in Technology, INOCON 2023
Y2 - 3 March 2023 through 5 March 2023
ER -