An example on estimating Weibull scale (eta) and shape (beta) parameters from sample failure data

K. R. Shailesh

doi:10.1109/iCATccT44854.2018.9001980

An example on estimating Weibull scale (eta) and shape (beta) parameters from sample failure data

K. R. Shailesh^*

^*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

3 Citations (Scopus)

Abstract

In this paper a example is discussed to obtain the shape and scale parameters of Weibull distribution. Parameters are estimated using sample time-to-failure data or lifetime data. There are several methods available for Weibull parameter estimation, in this paper a relatively simple method of linearizing the unreliability function and then fitting it to a straight line equation to obtain shape and scale parameters is discussed. Sample failure data of two different types of LED bulbs manufactured by different manufacturers is taken for analysis and parameter estimation.

Original language	English
Title of host publication	Proceedings of the 4th International Conference on Applied and Theoretical Computing and Communication Technology, iCATccT 2018
Editors	Dattathreya Dattathreya, J Praveen, D.V Manjunatha, Manjunatha Kotari, Jayanth Kumar Rathod
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	60-63
Number of pages	4
ISBN (Electronic)	9781538677063
DOIs	https://doi.org/10.1109/iCATccT44854.2018.9001980
Publication status	Published - 09-2018
Event	4th International Conference on Applied and Theoretical Computing and Communication Technology, iCATccT 2018 - Karnataka, India Duration: 06-09-2018 → 08-09-2018

Publication series

Name	Proceedings of the 4th International Conference on Applied and Theoretical Computing and Communication Technology, iCATccT 2018

Conference

Conference	4th International Conference on Applied and Theoretical Computing and Communication Technology, iCATccT 2018
Country/Territory	India
City	Karnataka
Period	06-09-18 → 08-09-18

All Science Journal Classification (ASJC) codes

Computer Science Applications
Hardware and Architecture
Computer Networks and Communications
Safety, Risk, Reliability and Quality
Control and Optimization
Instrumentation
Information Systems and Management

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10.1109/iCATccT44854.2018.9001980

Cite this

Shailesh, K. R. (2018). An example on estimating Weibull scale (eta) and shape (beta) parameters from sample failure data. In D. Dattathreya, J. Praveen, D. V. Manjunatha, M. Kotari, & J. K. Rathod (Eds.), Proceedings of the 4th International Conference on Applied and Theoretical Computing and Communication Technology, iCATccT 2018 (pp. 60-63). Article 9001980 (Proceedings of the 4th International Conference on Applied and Theoretical Computing and Communication Technology, iCATccT 2018). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/iCATccT44854.2018.9001980

Shailesh, K. R. / An example on estimating Weibull scale (eta) and shape (beta) parameters from sample failure data. Proceedings of the 4th International Conference on Applied and Theoretical Computing and Communication Technology, iCATccT 2018. editor / Dattathreya Dattathreya ; J Praveen ; D.V Manjunatha ; Manjunatha Kotari ; Jayanth Kumar Rathod. Institute of Electrical and Electronics Engineers Inc., 2018. pp. 60-63 (Proceedings of the 4th International Conference on Applied and Theoretical Computing and Communication Technology, iCATccT 2018).

@inproceedings{41b0347007024df1b1e6344cec8efb19,

title = "An example on estimating Weibull scale (eta) and shape (beta) parameters from sample failure data",

abstract = "In this paper a example is discussed to obtain the shape and scale parameters of Weibull distribution. Parameters are estimated using sample time-to-failure data or lifetime data. There are several methods available for Weibull parameter estimation, in this paper a relatively simple method of linearizing the unreliability function and then fitting it to a straight line equation to obtain shape and scale parameters is discussed. Sample failure data of two different types of LED bulbs manufactured by different manufacturers is taken for analysis and parameter estimation.",

author = "Shailesh, \{K. R.\}",

year = "2018",

month = sep,

doi = "10.1109/iCATccT44854.2018.9001980",

language = "English",

series = "Proceedings of the 4th International Conference on Applied and Theoretical Computing and Communication Technology, iCATccT 2018",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

pages = "60--63",

editor = "Dattathreya Dattathreya and J Praveen and D.V Manjunatha and Manjunatha Kotari and Rathod, \{Jayanth Kumar\}",

booktitle = "Proceedings of the 4th International Conference on Applied and Theoretical Computing and Communication Technology, iCATccT 2018",

address = "United States",

note = "4th International Conference on Applied and Theoretical Computing and Communication Technology, iCATccT 2018 ; Conference date: 06-09-2018 Through 08-09-2018",

}

Shailesh, KR 2018, An example on estimating Weibull scale (eta) and shape (beta) parameters from sample failure data. in D Dattathreya, J Praveen, DV Manjunatha, M Kotari & JK Rathod (eds), Proceedings of the 4th International Conference on Applied and Theoretical Computing and Communication Technology, iCATccT 2018., 9001980, Proceedings of the 4th International Conference on Applied and Theoretical Computing and Communication Technology, iCATccT 2018, Institute of Electrical and Electronics Engineers Inc., pp. 60-63, 4th International Conference on Applied and Theoretical Computing and Communication Technology, iCATccT 2018, Karnataka, India, 06-09-18. https://doi.org/10.1109/iCATccT44854.2018.9001980

An example on estimating Weibull scale (eta) and shape (beta) parameters from sample failure data. / Shailesh, K. R.
Proceedings of the 4th International Conference on Applied and Theoretical Computing and Communication Technology, iCATccT 2018. ed. / Dattathreya Dattathreya; J Praveen; D.V Manjunatha; Manjunatha Kotari; Jayanth Kumar Rathod. Institute of Electrical and Electronics Engineers Inc., 2018. p. 60-63 9001980 (Proceedings of the 4th International Conference on Applied and Theoretical Computing and Communication Technology, iCATccT 2018).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

TY - GEN

T1 - An example on estimating Weibull scale (eta) and shape (beta) parameters from sample failure data

AU - Shailesh, K. R.

PY - 2018/9

Y1 - 2018/9

N2 - In this paper a example is discussed to obtain the shape and scale parameters of Weibull distribution. Parameters are estimated using sample time-to-failure data or lifetime data. There are several methods available for Weibull parameter estimation, in this paper a relatively simple method of linearizing the unreliability function and then fitting it to a straight line equation to obtain shape and scale parameters is discussed. Sample failure data of two different types of LED bulbs manufactured by different manufacturers is taken for analysis and parameter estimation.

AB - In this paper a example is discussed to obtain the shape and scale parameters of Weibull distribution. Parameters are estimated using sample time-to-failure data or lifetime data. There are several methods available for Weibull parameter estimation, in this paper a relatively simple method of linearizing the unreliability function and then fitting it to a straight line equation to obtain shape and scale parameters is discussed. Sample failure data of two different types of LED bulbs manufactured by different manufacturers is taken for analysis and parameter estimation.

UR - https://www.scopus.com/pages/publications/85081392916

UR - https://www.scopus.com/pages/publications/85081392916#tab=citedBy

U2 - 10.1109/iCATccT44854.2018.9001980

DO - 10.1109/iCATccT44854.2018.9001980

M3 - Conference contribution

T3 - Proceedings of the 4th International Conference on Applied and Theoretical Computing and Communication Technology, iCATccT 2018

SP - 60

EP - 63

BT - Proceedings of the 4th International Conference on Applied and Theoretical Computing and Communication Technology, iCATccT 2018

A2 - Dattathreya, Dattathreya

A2 - Praveen, J

A2 - Manjunatha, D.V

A2 - Kotari, Manjunatha

A2 - Rathod, Jayanth Kumar

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 4th International Conference on Applied and Theoretical Computing and Communication Technology, iCATccT 2018

Y2 - 6 September 2018 through 8 September 2018

ER -

Shailesh KR. An example on estimating Weibull scale (eta) and shape (beta) parameters from sample failure data. In Dattathreya D, Praveen J, Manjunatha DV, Kotari M, Rathod JK, editors, Proceedings of the 4th International Conference on Applied and Theoretical Computing and Communication Technology, iCATccT 2018. Institute of Electrical and Electronics Engineers Inc. 2018. p. 60-63. 9001980. (Proceedings of the 4th International Conference on Applied and Theoretical Computing and Communication Technology, iCATccT 2018). doi: 10.1109/iCATccT44854.2018.9001980

An example on estimating Weibull scale (eta) and shape (beta) parameters from sample failure data

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