Annealing-induced phase transformation in vapor deposited tellurium dioxide thin films and its structural, chemical analysis

K. Chandra, M. G. Mahesha, Pramoda Kumara Shetty*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

1 Citation (Scopus)

Fingerprint

Dive into the research topics of 'Annealing-induced phase transformation in vapor deposited tellurium dioxide thin films and its structural, chemical analysis'. Together they form a unique fingerprint.

INIS

Material Science

Engineering