Application of accelerated life testing principles to project long term lumen maintenance of LED luminaires

K. R. Shailesh; Ciji Pearl Kurian; Savitha G. Kini; S. Tanuja; M. Vijendra Kamath

doi:10.1109/ICETEEEM.2012.6494512

Application of accelerated life testing principles to project long term lumen maintenance of LED luminaires

K. R. Shailesh, Ciji Pearl Kurian, Savitha G. Kini, S. Tanuja, M. Vijendra Kamath

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

9 Citations (Scopus)

Abstract

This work presents our effort to predict the long term reliability of LED arrays using the application of accelerated life testing principles. Assessment of long term reliability and performance of LED arrays is a testing exercise but it is also vital for successful acceptance of Solid State Lighting (SSL) systems. The objective of this work is to analyze IESNA LM-80 test data obtained from the LED manufacturers to study how failure is accelerated by stress and fit an acceleration model to the data. This acceleration model can be used to accurately project the reliability of the LED arrays under normal operating conditions. The methodology was to apply statistical analysis to LM-80 test data and obtain accelerated models for life-stress relationships and life-time distributions. The Arrhenius-Weibull, Generalised Eyring-Weibull and Inverse Power-Weibull models were obtained and were compared for their effectiveness in to predicting the reliability of LED arrays.

Original language	English
Title of host publication	Proceedings - ICETEEEM 2012, International Conference on Emerging Trends in Electrical Engineering and Energy Management
Pages	483-488
Number of pages	6
DOIs	https://doi.org/10.1109/ICETEEEM.2012.6494512
Publication status	Published - 2012
Event	International Conference on Emerging Trends in Electrical Engineering and Energy Management, ICETEEEM 2012 - Chennai, Tamil Nadu, India Duration: 13-12-2012 → 15-12-2012

Conference

Conference	International Conference on Emerging Trends in Electrical Engineering and Energy Management, ICETEEEM 2012
Country/Territory	India
City	Chennai, Tamil Nadu
Period	13-12-12 → 15-12-12

All Science Journal Classification (ASJC) codes

Energy Engineering and Power Technology
Electrical and Electronic Engineering

Access to Document

10.1109/ICETEEEM.2012.6494512

Cite this

Shailesh, K. R., Kurian, C. P., Kini, S. G., Tanuja, S., & Kamath, M. V. (2012). Application of accelerated life testing principles to project long term lumen maintenance of LED luminaires. In Proceedings - ICETEEEM 2012, International Conference on Emerging Trends in Electrical Engineering and Energy Management (pp. 483-488). [6494512] https://doi.org/10.1109/ICETEEEM.2012.6494512

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title = "Application of accelerated life testing principles to project long term lumen maintenance of LED luminaires",

abstract = "This work presents our effort to predict the long term reliability of LED arrays using the application of accelerated life testing principles. Assessment of long term reliability and performance of LED arrays is a testing exercise but it is also vital for successful acceptance of Solid State Lighting (SSL) systems. The objective of this work is to analyze IESNA LM-80 test data obtained from the LED manufacturers to study how failure is accelerated by stress and fit an acceleration model to the data. This acceleration model can be used to accurately project the reliability of the LED arrays under normal operating conditions. The methodology was to apply statistical analysis to LM-80 test data and obtain accelerated models for life-stress relationships and life-time distributions. The Arrhenius-Weibull, Generalised Eyring-Weibull and Inverse Power-Weibull models were obtained and were compared for their effectiveness in to predicting the reliability of LED arrays.",

author = "Shailesh, {K. R.} and Kurian, {Ciji Pearl} and Kini, {Savitha G.} and S. Tanuja and Kamath, {M. Vijendra}",

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Shailesh, KR , Kurian, CP , Kini, SG , Tanuja, S & Kamath, MV 2012, Application of accelerated life testing principles to project long term lumen maintenance of LED luminaires. in Proceedings - ICETEEEM 2012, International Conference on Emerging Trends in Electrical Engineering and Energy Management., 6494512, pp. 483-488, International Conference on Emerging Trends in Electrical Engineering and Energy Management, ICETEEEM 2012, Chennai, Tamil Nadu, India, 13-12-12. https://doi.org/10.1109/ICETEEEM.2012.6494512

Application of accelerated life testing principles to project long term lumen maintenance of LED luminaires. / Shailesh, K. R.; Kurian, Ciji Pearl ; Kini, Savitha G. et al.
Proceedings - ICETEEEM 2012, International Conference on Emerging Trends in Electrical Engineering and Energy Management. 2012. p. 483-488 6494512.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

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Application of accelerated life testing principles to project long term lumen maintenance of LED luminaires

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