TY - GEN
T1 - Automated Wheat Rust Disease Classification Using Convolutional Neural Networks With Transfer Learning
AU - Tola, Fitsum Getachew
AU - Blitti, Kokou Elvis Khorem
AU - Diwan, Anjali
AU - Mahadeva, Rajesh
N1 - Publisher Copyright:
© 2024 IEEE.
PY - 2024
Y1 - 2024
N2 - Wheat, a cornerstone crop nourishing billions globally, faces a substantial threat from various diseases. Among these, wheat rust, caused by parasitic fungi, stands out as a major cause of yield loss. Early and accurate detection of this disease plays a crucial role in minimizing crop devastation and ensuring global food security. This work explores the automatic classification of wheat diseases using transfer learning. We examine the performance of four deep convolutional neural networks (CNNs) that have already been trained: VGG16, MobileNet, InceptionV3, and InceptionResNetV2. These models were trained on a curated dataset encompassing three distinct classes: healthy wheat leaves, brown (leaf) rust, and yellow (strip) rust. Our investigation revealed that the proposed approach, utilizing the VGG16 model, achieved a remarkable accuracy of 97.95%. Furthermore, the model exhibited exceptional recall performance, demonstrating its ability to effectively identify diseased wheat instances. Notably, the VGG16 model achieved a perfect recall of 100% for brown rust detection and a very high recall of 96% for yellow rust. This exceptional performance underlines the effectiveness of VGG16 in accurately classifying diseased wheat plants. These findings pave the way for the utilization of transfer learning with VGG16 in real-world applications aimed at early detection of wheat rust. By enabling rapid and precise identification of diseased crops, this approach has the potential to significantly contribute to improved crop management practices, reduced losses, and ultimately, enhanced global food security.
AB - Wheat, a cornerstone crop nourishing billions globally, faces a substantial threat from various diseases. Among these, wheat rust, caused by parasitic fungi, stands out as a major cause of yield loss. Early and accurate detection of this disease plays a crucial role in minimizing crop devastation and ensuring global food security. This work explores the automatic classification of wheat diseases using transfer learning. We examine the performance of four deep convolutional neural networks (CNNs) that have already been trained: VGG16, MobileNet, InceptionV3, and InceptionResNetV2. These models were trained on a curated dataset encompassing three distinct classes: healthy wheat leaves, brown (leaf) rust, and yellow (strip) rust. Our investigation revealed that the proposed approach, utilizing the VGG16 model, achieved a remarkable accuracy of 97.95%. Furthermore, the model exhibited exceptional recall performance, demonstrating its ability to effectively identify diseased wheat instances. Notably, the VGG16 model achieved a perfect recall of 100% for brown rust detection and a very high recall of 96% for yellow rust. This exceptional performance underlines the effectiveness of VGG16 in accurately classifying diseased wheat plants. These findings pave the way for the utilization of transfer learning with VGG16 in real-world applications aimed at early detection of wheat rust. By enabling rapid and precise identification of diseased crops, this approach has the potential to significantly contribute to improved crop management practices, reduced losses, and ultimately, enhanced global food security.
UR - https://www.scopus.com/pages/publications/85211957973
UR - https://www.scopus.com/pages/publications/85211957973#tab=citedBy
U2 - 10.1109/TENSYMP61132.2024.10752155
DO - 10.1109/TENSYMP61132.2024.10752155
M3 - Conference contribution
AN - SCOPUS:85211957973
T3 - 2024 IEEE Region 10 Symposium, TENSYMP 2024
BT - 2024 IEEE Region 10 Symposium, TENSYMP 2024
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2024 IEEE Region 10 Symposium, TENSYMP 2024
Y2 - 27 September 2024 through 29 September 2024
ER -