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Automated Wheat Rust Disease Classification Using Convolutional Neural Networks With Transfer Learning

  • Fitsum Getachew Tola
  • , Kokou Elvis Khorem Blitti
  • , Anjali Diwan
  • , Rajesh Mahadeva

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Wheat, a cornerstone crop nourishing billions globally, faces a substantial threat from various diseases. Among these, wheat rust, caused by parasitic fungi, stands out as a major cause of yield loss. Early and accurate detection of this disease plays a crucial role in minimizing crop devastation and ensuring global food security. This work explores the automatic classification of wheat diseases using transfer learning. We examine the performance of four deep convolutional neural networks (CNNs) that have already been trained: VGG16, MobileNet, InceptionV3, and InceptionResNetV2. These models were trained on a curated dataset encompassing three distinct classes: healthy wheat leaves, brown (leaf) rust, and yellow (strip) rust. Our investigation revealed that the proposed approach, utilizing the VGG16 model, achieved a remarkable accuracy of 97.95%. Furthermore, the model exhibited exceptional recall performance, demonstrating its ability to effectively identify diseased wheat instances. Notably, the VGG16 model achieved a perfect recall of 100% for brown rust detection and a very high recall of 96% for yellow rust. This exceptional performance underlines the effectiveness of VGG16 in accurately classifying diseased wheat plants. These findings pave the way for the utilization of transfer learning with VGG16 in real-world applications aimed at early detection of wheat rust. By enabling rapid and precise identification of diseased crops, this approach has the potential to significantly contribute to improved crop management practices, reduced losses, and ultimately, enhanced global food security.

Original languageEnglish
Title of host publication2024 IEEE Region 10 Symposium, TENSYMP 2024
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9798350364866
DOIs
Publication statusPublished - 2024
Event2024 IEEE Region 10 Symposium, TENSYMP 2024 - New Delhi, India
Duration: 27-09-202429-09-2024

Publication series

Name2024 IEEE Region 10 Symposium, TENSYMP 2024

Conference

Conference2024 IEEE Region 10 Symposium, TENSYMP 2024
Country/TerritoryIndia
CityNew Delhi
Period27-09-2429-09-24

All Science Journal Classification (ASJC) codes

  • Waste Management and Disposal
  • Health Informatics
  • Artificial Intelligence
  • Computer Networks and Communications
  • Computer Science Applications
  • Computer Vision and Pattern Recognition
  • Energy Engineering and Power Technology

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