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CMOS-MEMS Nano Force Sensor with Sub-μm U-Channel Suspended Gate SOIFET

  • Pramod Martha*
  • , Naveen Kadayinti
  • , V. Seena
  • *Corresponding author for this work

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Abstract

    This article presents a novel sub-μM U-channel suspended gate SOIFET (USG-SOIFET) based nano-force sensor. The pseudo short channel effect in suspended gate FET (SGFET) is discussed, and the channel length of USG-SOIFET is reduced to 0.95 μM with an air-gap of 200 nm. This helps in improving the sensitivity of USG-SOIFET and makes it a suitable candidate to detect forces in the nano-newton range. The gate is attached to the MEMS structure. A four L-shaped MEMS structure is designed with a mechanical sensitivity of 0.08 nm/nN and a resonant frequency of 3.8 kHz. The air-gap values for different forces are obtained from the finite element method (FEM) simulation of MEMS structure and used as input to TCAD for USG-SOIFET simulations to get the final sensor response. The area of the sensor is only (0.38 × 0.38) mm2 with a sensitivity of 0.425 μ A/nN at an operating voltage of 3 V. The detection range of the proposed sensor is 1 nN to 1μN, and the response is highly linear with a non-linearity of about 0.4 %.

    Original languageEnglish
    Title of host publicationAPSCON 2023 - IEEE Applied Sensing Conference, Symposium Proceedings
    PublisherInstitute of Electrical and Electronics Engineers Inc.
    ISBN (Electronic)9781665461634
    DOIs
    Publication statusPublished - 2023
    Event2023 IEEE Applied Sensing Conference, APSCON 2023 - Bengaluru, India
    Duration: 23-01-202325-01-2023

    Publication series

    NameAPSCON 2023 - IEEE Applied Sensing Conference, Symposium Proceedings

    Conference

    Conference2023 IEEE Applied Sensing Conference, APSCON 2023
    Country/TerritoryIndia
    CityBengaluru
    Period23-01-2325-01-23

    All Science Journal Classification (ASJC) codes

    • Electrical and Electronic Engineering
    • Electronic, Optical and Magnetic Materials
    • Instrumentation

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