Defect density estimation in Nanocluster carbon thin films

Shounak De, B. S. Satyanarayana, Mohan Rao, V. H S Moorthy

Research output: Contribution to journalArticlepeer-review

3 Citations (Scopus)

Fingerprint

Dive into the research topics of 'Defect density estimation in Nanocluster carbon thin films'. Together they form a unique fingerprint.

INIS

Engineering

Material Science