Abstract
This article presents a semisupervised machine learning approach to identify pediatric foot deformities using foot plantar pressure measurements. It synergistically combines the benefits of PCA for feature extraction and the Kantorovich distance to handle deformities.
| Original language | English |
|---|---|
| Pages (from-to) | 61-68 |
| Number of pages | 8 |
| Journal | IEEE Design and Test |
| Volume | 40 |
| Issue number | 4 |
| DOIs | |
| Publication status | Published - 01-08-2023 |
All Science Journal Classification (ASJC) codes
- Software
- Hardware and Architecture
- Electrical and Electronic Engineering
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