Direct correlation between the band gap and dielectric loss in Hf doped BaTiO3

Aanchal Sati, Anil Kumar, Vikash Mishra, Kamal Warshi, Archna Sagdeo, Shahid Anwar, Rajesh Kumar, P. R. Sagdeo*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

26 Citations (Scopus)

Abstract

Effect of Hf doping at Ti site in BaTiO3 on the optical band gap (Eg), Urbach energy (Eu), dielectric constant (ε) and dielec-tric loss i.e. loss tangent (tanδ) have been investigated. It has been observed that with Hf doping, the value of Eg and Eu systematically increases whereas; the value of dielectric constant and dielectric loss systematically decreases. The decrease in the value of dielectric constant has been explained in terms of reduction in the tetragonality i.e. by c/a ratio. In the present investigation, it has been proposed that increase in the value of Eg and Eu, leads to decrease in the tunneling probability of electron from valence band to the conduction band which may result in decrease in the value of the dielectric loss. Present investigations clearly suggest that the value of dielectric loss is effectively controlled by Eg. Thus, through present studies, a new methodology has been proposed for understanding the origin of dielectric loss. Moreover, a possible correlation between the Eg and tanδ in terms of tunneling probability has been provided.

Original languageEnglish
Pages (from-to)8064-8070
Number of pages7
JournalJournal of Materials Science: Materials in Electronics
Volume30
Issue number8
DOIs
Publication statusPublished - 04-2019

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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