Effect of electron beam irradiation on thermally evaporated Ge2Sb2Te5 thin films

Deepangkar Sarkar, G. Sanjeev, T. N. Bhat, M. G. Mahesha*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

Abstract

Ge2Sb2Te5 (GST) thin films have been grown by thermal evaporation technique. The grown films have been irradiated with electron beam at various doses. As-deposited and irradiated films have been characterized for their structural, optical and electrical properties. Raman spectra has been recorded to get more insight on structural rearrangement that happened during the irradiation process. Detailed analysis of these data has been made to explore the behavior of system under electron irradiation environment.

Original languageEnglish
Pages (from-to)84-89
Number of pages6
JournalJournal of Optoelectronics and Advanced Materials
Volume20
Issue number1-2
Publication statusPublished - 01-01-2018

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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