TY - JOUR
T1 - Effect of electron irradiation on the optical properties of SrTiO3
T2 - An experimental and theoretical investigations
AU - Mishra, Vikash
AU - Sati, Aanchal
AU - Warshi, M. Kamal
AU - Phatangare, Ambadas B.
AU - Dhole, Sanjay
AU - Bhoraskar, V. N.
AU - Ghosh, Harnath
AU - Sagdeo, Archna
AU - Mishra, Vinayak
AU - Kumar, Rajesh
AU - Sagdeo, P. R.
N1 - Publisher Copyright:
© 2018 IOP Publishing Ltd.
PY - 2018/3
Y1 - 2018/3
N2 - Diffuse reflectance spectroscopy (DRS) measurement has been carried out on pure and electron irradiated single crystal samples of SrTiO3. Interestingly, it has been observed that electron-irradiated sample have new absorption peak in optical absorption spectra. In order to understand the origin of a new absorption peak in electron irradiated sample, first principle calculation for optical spectra considering defects at Sr, Ti and O site using GGA + approximation have been carried out. It has been observed that the features present in the experimental optical absorption spectra match with that of simulated one having oxygen vacancy. Present investigation suggests that high energy electron irradiation produces oxygen defects in SrTiO3 and DRS is found to be a useful technique to probe the signature of such defects experimentally.
AB - Diffuse reflectance spectroscopy (DRS) measurement has been carried out on pure and electron irradiated single crystal samples of SrTiO3. Interestingly, it has been observed that electron-irradiated sample have new absorption peak in optical absorption spectra. In order to understand the origin of a new absorption peak in electron irradiated sample, first principle calculation for optical spectra considering defects at Sr, Ti and O site using GGA + approximation have been carried out. It has been observed that the features present in the experimental optical absorption spectra match with that of simulated one having oxygen vacancy. Present investigation suggests that high energy electron irradiation produces oxygen defects in SrTiO3 and DRS is found to be a useful technique to probe the signature of such defects experimentally.
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U2 - 10.1088/2053-1591/aab6f5
DO - 10.1088/2053-1591/aab6f5
M3 - Article
AN - SCOPUS:85045614136
SN - 2053-1591
VL - 5
JO - Materials Research Express
JF - Materials Research Express
IS - 3
M1 - 036210
ER -