Skip to main navigation Skip to search Skip to main content

Electron beam induced modifications in third harmonic process of spray coated Mn: ZnO nanostructures

  • Albin Antony
  • , P. Poornesh
  • , I. V. Kityk
  • , K. Ozga
  • , Reji Philip
  • , Ganesh Sanjeev
  • , Vikash Chandra Petwal
  • , Vijay Pal Verma
  • , Jishnu Dwivedi

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Abstract

    We report the energetic 8 MeV electron beam induced modification on linear and nonlinear optical process in Mn doped ZnO (MZO) thin films at different irradiation dosage. The modifications incorporated on third order nonlinear optical absorption were studied using Z-Scan technique in both continuous and pulsed laser regime. Open aperture Z-scan measurement indicates that pristine and film treated at 15 kGy electron beam dosages reveals reverse saturable absorption (RSA) mechanism and films treated at 5 kGy, 10 kGy and 20 kGy exhibits saturable absorption (SA) phenomena. The irradiation resulted in a high βeff value of 12.1 ×10 -2 cm/W in continuous wave excitation and 5.6×10 -4 cm/W for pulsed excitation as compared pristine films. Gaussian deconvolution fitting on room temperature PL spectra shows a quenching of defect centers upon electron beam irradiation. The observed decrement in PL emission intensity for the films treated with energetic electron beam can be probably due to recombination of defect centers and enhanced non radiative defects. The decrease in the energy band gap and increase in the urbach energy of the MZO thin films was observed due to creation of deep energy levels into the band gap. The irradiation treatment resulted in significant changes on the crucial parameters of optical sensing such as limiting threshold and optical clamping. The present study indicates that nonlinear parameters of MZO thin films can be tuned by choosing appropriate electron beam dosage for photonics applications.

    Original languageEnglish
    Title of host publicationOxide-Based Materials and Devices X
    EditorsDavid J. Rogers, Ferechteh H. Teherani, David C. Look
    PublisherSPIE
    ISBN (Electronic)9781510624801
    DOIs
    Publication statusPublished - 01-01-2019
    EventOxide-Based Materials and Devices X 2019 - San Francisco, United States
    Duration: 03-02-201907-02-2019

    Publication series

    NameProceedings of SPIE - The International Society for Optical Engineering
    Volume10919
    ISSN (Print)0277-786X
    ISSN (Electronic)1996-756X

    Conference

    ConferenceOxide-Based Materials and Devices X 2019
    Country/TerritoryUnited States
    CitySan Francisco
    Period03-02-1907-02-19

    All Science Journal Classification (ASJC) codes

    • Electronic, Optical and Magnetic Materials
    • Condensed Matter Physics
    • Computer Science Applications
    • Applied Mathematics
    • Electrical and Electronic Engineering

    Fingerprint

    Dive into the research topics of 'Electron beam induced modifications in third harmonic process of spray coated Mn: ZnO nanostructures'. Together they form a unique fingerprint.

    Cite this