Enhanced Fault Detection in Industrial Process via a Hellinger Distance-Based Data-Driven Scheme
- Mohammed Affan*
- , K. Ramakrishna Kini
- , Muddu Madakyaru
- , Fouzi Harrou
- , Mukund Kumar Menon
- , Ying Sun
*Corresponding author for this work
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution