Enhancing Quality Control in Industry 4.0 by Leveraging Deep Learning and Machine Vision for Defect Detection and Process Optimization

Lalit N. Patil; Vikash K. Agrawal; Lalit K. Toke; Swapnil S. Jadhav; Vikas S. Panwar; Vikram Puri

doi:10.1201/9781003538271-21

Enhancing Quality Control in Industry 4.0 by Leveraging Deep Learning and Machine Vision for Defect Detection and Process Optimization

Lalit N. Patil^*
, Vikash K. Agrawal
, Lalit K. Toke
, Swapnil S. Jadhav
, Vikas S. Panwar
, Vikram Puri

^*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Chapter

Original language	English
Title of host publication	Transforming Industries
Subtitle of host publication	Capturing the Potential of IIoT and ML in the Era of Industry 5.0
Publisher	CRC Press
Pages	249-258
Number of pages	10
ISBN (Electronic)	9781003538271
ISBN (Print)	9781032884479
DOIs	https://doi.org/10.1201/9781003538271-21
Publication status	Published - 28-10-2025

All Science Journal Classification (ASJC) codes

General Engineering
General Arts and Humanities
General Business,Management and Accounting
General Social Sciences
General Energy

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10.1201/9781003538271-21

Cite this

Patil, L. N., Agrawal, V. K., Toke, L. K., Jadhav, S. S., Panwar, V. S., & Puri, V. (2025). Enhancing Quality Control in Industry 4.0 by Leveraging Deep Learning and Machine Vision for Defect Detection and Process Optimization. In Transforming Industries: Capturing the Potential of IIoT and ML in the Era of Industry 5.0 (pp. 249-258). CRC Press. https://doi.org/10.1201/9781003538271-21

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Enhancing Quality Control in Industry 4.0 by Leveraging Deep Learning and Machine Vision for Defect Detection and Process Optimization. / Patil, Lalit N.; Agrawal, Vikash K.; Toke, Lalit K. et al.
Transforming Industries: Capturing the Potential of IIoT and ML in the Era of Industry 5.0. CRC Press, 2025. p. 249-258.

Research output: Chapter in Book/Report/Conference proceeding › Chapter

TY - CHAP

T1 - Enhancing Quality Control in Industry 4.0 by Leveraging Deep Learning and Machine Vision for Defect Detection and Process Optimization

AU - Patil, Lalit N.

AU - Agrawal, Vikash K.

AU - Toke, Lalit K.

AU - Jadhav, Swapnil S.

AU - Panwar, Vikas S.

AU - Puri, Vikram

PY - 2025/10/28

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SP - 249

EP - 258

BT - Transforming Industries

PB - CRC Press

ER -

Enhancing Quality Control in Industry 4.0 by Leveraging Deep Learning and Machine Vision for Defect Detection and Process Optimization

All Science Journal Classification (ASJC) codes

Access to Document

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