Abstract
Herein, we report the role of indium (In) on the carbon monoxide sensing of ZnO thin films using a low-cost spray pyrolysis technique. The decrease in crystalline size was observed from XRD studies and hexagonal wurtzite structure was confirmed. Photoluminescence and XPS studies proved the presence of various defects in the films. The gas-sensing properties of films toward carbon monoxide (CO) gas indicate that 15 wt% of In in ZnO thin films (IZO) exhibit high response (1.84) to a low concentration of the gas (1 ppm) at 300 °C compared to undoped ZnO (0.53). The observed high response of 15 wt% IZO can be mainly endorsed to the oxygen vacancy defects as observed from the photoluminescence and XPS analysis. Further, the high response is complemented by high surface area and smaller grain size (~ 13.1 nm) with well-defined grain boundaries as evident from SEM analysis as well as XRD studies.
Original language | English |
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Pages (from-to) | 22599 - 22616 |
Number of pages | 18 |
Journal | Journal of Materials Science: Materials in Electronics |
Volume | 32 |
Issue number | 17 |
DOIs | |
Publication status | Published - 09-2021 |
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics
- Condensed Matter Physics
- Electrical and Electronic Engineering