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Fabrication and thermal analysis of flip-chip light-emitting diodes with different numbers of Au stub bumps

  • Cheng Chen Lin*
  • , Liann Be Chang
  • , Ming Jer Jeng
  • , Chia Yi Yen
  • , Atanu Das
  • , Chung Yi Tang
  • , Ming Yi Tsai
  • , Mu Jen Lai
  • *Corresponding author for this work

    Research output: Contribution to journalArticlepeer-review

    Abstract

    The thermal performance of flip-chip (FC) light-emitting diodes (LEDs) with different numbers of Au stub bumps has been investigated by using thermosonic bonder. The LEDs were mounted on the aluminium nitride (AlN) sub-mounts which have superior thermal conductivity (230 W/mK), and the high power Chip-on-Plate (COP) package was proposed to be used for our measurement. In order to understand the thermal performance of the high power FC-LEDs, the experimental measurement and finite-element model (FRM) numerical simulation have been used. It is found that the thermal performance of our 1 × 1 mm2 FC-LEDs can only be improved when using at least 6 Au stub bumps as interconnected metals. Moreover, the surface temperature of FC-LEDs is significantly reduced while using 20 Au stub bumps.

    Original languageEnglish
    Pages (from-to)683-687
    Number of pages5
    JournalMicroelectronics Reliability
    Volume50
    Issue number5
    DOIs
    Publication statusPublished - 05-2010

    All Science Journal Classification (ASJC) codes

    • Electronic, Optical and Magnetic Materials
    • Atomic and Molecular Physics, and Optics
    • Safety, Risk, Reliability and Quality
    • Condensed Matter Physics
    • Surfaces, Coatings and Films
    • Electrical and Electronic Engineering

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