TY - JOUR
T1 - Ferroelectric Negative-Capacitance-Assisted Phase-Transition Field-Effect Transistor
AU - Yadav, Sameer
AU - Upadhyay, Pranshoo
AU - Awadhiya, Bhaskar
AU - Kondekar, Pravin N.
N1 - Publisher Copyright:
1525-8955 © 2021 IEEE. Personal use is permitted, but republication/redistribution requires IEEE permission. See https://www.ieee.org/publications/rights/index.html for more information.
PY - 2022/2/1
Y1 - 2022/2/1
N2 - An enormous study is being carried out in the field of emerging steep slope devices, specifically on negative-capacitance-based and phase transition-based devices. This article investigates the action of ferroelectric (FE) and phase transition material (PTM) on a hybrid device, negative-capacitance-assisted phase transition FinFET (NC-PT-FinFET). We encounter several unique phenomena resulting from this unified action and provide valid arguments based on these observations. A significant enhancement in the differential gain and transconductance, a unique variation in the effect of PTM on drain-channel coupling, tunability of hysteresis across PTM by FE thickness( {t}_{text {fe}} ), and ultralow subthreshold slope (SS) by lowering both of its factors are some of the major outcomes of the NC-PT-FinFET. Focus is built on comprehending the individual role of FE and PTM in the intriguing features observed in every device performance parameter with the help of mathematical expressions and physical interpretations. Various tunable parameters present in this hybrid device widen its applicability in digital and memory applications.
AB - An enormous study is being carried out in the field of emerging steep slope devices, specifically on negative-capacitance-based and phase transition-based devices. This article investigates the action of ferroelectric (FE) and phase transition material (PTM) on a hybrid device, negative-capacitance-assisted phase transition FinFET (NC-PT-FinFET). We encounter several unique phenomena resulting from this unified action and provide valid arguments based on these observations. A significant enhancement in the differential gain and transconductance, a unique variation in the effect of PTM on drain-channel coupling, tunability of hysteresis across PTM by FE thickness( {t}_{text {fe}} ), and ultralow subthreshold slope (SS) by lowering both of its factors are some of the major outcomes of the NC-PT-FinFET. Focus is built on comprehending the individual role of FE and PTM in the intriguing features observed in every device performance parameter with the help of mathematical expressions and physical interpretations. Various tunable parameters present in this hybrid device widen its applicability in digital and memory applications.
UR - https://www.scopus.com/pages/publications/85120031362
UR - https://www.scopus.com/inward/citedby.url?scp=85120031362&partnerID=8YFLogxK
U2 - 10.1109/TUFFC.2021.3130194
DO - 10.1109/TUFFC.2021.3130194
M3 - Article
C2 - 34813473
AN - SCOPUS:85120031362
SN - 0885-3010
VL - 69
SP - 863
EP - 869
JO - IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control
JF - IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control
IS - 2
ER -