Fine structure in spatial self-phase modulation patterns: At a glance determination of the sign of optical nonlinearity in highly nonlinear films

L. Lucchetti*, S. Suchand, F. Simoni

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

19 Citations (Scopus)

Abstract

We present a fast and simple method to determine the sign of the nonlinear coefficient n2 in films with high nonlinearity. The method exploits the effect of spatial self-phase modulation and the role of wavefront curvature that leads to a specific far field pattern that is dependent on the sign of n2 and on the sample position. The method can be considered a 'visualization' of the Z-scan for highly nonlinear films. Application to nematic liquid crystals under different experimental conditions confirms the results expected from the theory.

Original languageEnglish
Article number034002
JournalJournal of Optics A: Pure and Applied Optics
Volume11
Issue number3
DOIs
Publication statusPublished - 2009

All Science Journal Classification (ASJC) codes

  • Atomic and Molecular Physics, and Optics

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