Skip to main navigation Skip to search Skip to main content

Fog Computing Based Hybrid Deep Learning Framework in effective inspection system for smart manufacturing

  • Shih Yang Lin
  • , Yun Du*
  • , Po Chang Ko
  • , Tzu Jung Wu
  • , Ping Tsan Ho
  • , V. Sivakumar
  • , Rama subbareddy
  • *Corresponding author for this work

    Research output: Contribution to journalArticlepeer-review

    Abstract

    Most sensors have been taken up, which resulted in a massive data size, with the continuously growing IoT (Internet of Things) devices and communications infrastructure in development. The inspection of the manufacturer to identify product defects is one of the most common examples. In order to develop an effective inspection system with greater precision, this paper has been proposed a Fog Computing based Hybrid Deep-Learning Framework (FC-HDLF), that can find possible defective products. Since a large number of assembly lines can occur in a single factory, one of the main problems is how these data are processed in real-time. The system can handle incredibly large amounts of data by discharging the load from the central servers to the fog nodes. In this paper, there are two obvious advantages. Next, the Convolutional Neural Network (CNN) model is adapted to the fog computing environment, which improves its calculation performance considerably. The other is that a model of control is built that can display the form and extent of the defect simultaneously. A decision-making framework for multi-agents is built to ensure a production process architecture to optimize production processes.

    Original languageEnglish
    Pages (from-to)636-642
    Number of pages7
    JournalComputer Communications
    Volume160
    DOIs
    Publication statusPublished - 01-07-2020

    All Science Journal Classification (ASJC) codes

    • Computer Networks and Communications

    Fingerprint

    Dive into the research topics of 'Fog Computing Based Hybrid Deep Learning Framework in effective inspection system for smart manufacturing'. Together they form a unique fingerprint.

    Cite this