Fourier-transform infrared absorption study of the nanocluster carbon thin films grown using cathodic arc process

Shounak De; B. S. Satyanarayana; Shailesh Sharma; K. Mohan Rao

doi:10.1063/1.3605921

Fourier-transform infrared absorption study of the nanocluster carbon thin films grown using cathodic arc process

Shounak De, B. S. Satyanarayana, Shailesh Sharma, K. Mohan Rao

Department of Electronics and Communication Engineering, Manipal Institute of Technology, Manipal
Department of Physics, Manipal Institute of Technology, Manipal

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

1 Citation (Scopus)

Abstract

Nanocluster carbon thin films are deposited on Silicon Substrate using Cathodic Arc process. These films are mixed phased materials containing both sp² and sp³ bondings. The surface morphology is characterized by Fourier-Transform Infrared Spectroscopy (FTIR) to find out different vibrational modes in these films. The various bendings modes with Olefinic and aromatic structures are associated with a broad absorption band between 1130 and 1550cm^-1. The peaks in and around 2900cm ^-1 shows various stretching modes of C-H_n (n=1,2,3).

Original language	English
Title of host publication	Solid State Physics - Proceedings of the 55th DAE Solid State Physics Symposium 2010
Pages	435-436
Number of pages	2
Volume	1349
Edition	PART A
DOIs	https://doi.org/10.1063/1.3605921
Publication status	Published - 2011
Event	55th DAE Solid State Physics Symposium 2010 - Manipal, India Duration: 26-12-2010 → 30-12-2010

Conference

Conference	55th DAE Solid State Physics Symposium 2010
Country/Territory	India
City	Manipal
Period	26-12-10 → 30-12-10

All Science Journal Classification (ASJC) codes

Physics and Astronomy(all)

Access to Document

10.1063/1.3605921

Cite this

@inproceedings{a8f035bedb1e4acd8262c57f9ff19b1f,

title = "Fourier-transform infrared absorption study of the nanocluster carbon thin films grown using cathodic arc process",

abstract = "Nanocluster carbon thin films are deposited on Silicon Substrate using Cathodic Arc process. These films are mixed phased materials containing both sp2 and sp3 bondings. The surface morphology is characterized by Fourier-Transform Infrared Spectroscopy (FTIR) to find out different vibrational modes in these films. The various bendings modes with Olefinic and aromatic structures are associated with a broad absorption band between 1130 and 1550cm-1. The peaks in and around 2900cm -1 shows various stretching modes of C-Hn (n=1,2,3).",

author = "Shounak De and Satyanarayana, {B. S.} and Shailesh Sharma and Rao, {K. Mohan}",

year = "2011",

doi = "10.1063/1.3605921",

language = "English",

isbn = "9780735409057",

volume = "1349",

pages = "435--436",

booktitle = "Solid State Physics - Proceedings of the 55th DAE Solid State Physics Symposium 2010",

edition = "PART A",

note = "55th DAE Solid State Physics Symposium 2010 ; Conference date: 26-12-2010 Through 30-12-2010",

}

De, S, Satyanarayana, BS, Sharma, S & Rao, KM 2011, Fourier-transform infrared absorption study of the nanocluster carbon thin films grown using cathodic arc process. in Solid State Physics - Proceedings of the 55th DAE Solid State Physics Symposium 2010. PART A edn, vol. 1349, pp. 435-436, 55th DAE Solid State Physics Symposium 2010, Manipal, India, 26-12-10. https://doi.org/10.1063/1.3605921

Fourier-transform infrared absorption study of the nanocluster carbon thin films grown using cathodic arc process. / De, Shounak; Satyanarayana, B. S.; Sharma, Shailesh et al.
Solid State Physics - Proceedings of the 55th DAE Solid State Physics Symposium 2010. Vol. 1349 PART A. ed. 2011. p. 435-436.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

TY - GEN

T1 - Fourier-transform infrared absorption study of the nanocluster carbon thin films grown using cathodic arc process

AU - De, Shounak

AU - Satyanarayana, B. S.

AU - Sharma, Shailesh

AU - Rao, K. Mohan

PY - 2011

Y1 - 2011

N2 - Nanocluster carbon thin films are deposited on Silicon Substrate using Cathodic Arc process. These films are mixed phased materials containing both sp2 and sp3 bondings. The surface morphology is characterized by Fourier-Transform Infrared Spectroscopy (FTIR) to find out different vibrational modes in these films. The various bendings modes with Olefinic and aromatic structures are associated with a broad absorption band between 1130 and 1550cm-1. The peaks in and around 2900cm -1 shows various stretching modes of C-Hn (n=1,2,3).

AB - Nanocluster carbon thin films are deposited on Silicon Substrate using Cathodic Arc process. These films are mixed phased materials containing both sp2 and sp3 bondings. The surface morphology is characterized by Fourier-Transform Infrared Spectroscopy (FTIR) to find out different vibrational modes in these films. The various bendings modes with Olefinic and aromatic structures are associated with a broad absorption band between 1130 and 1550cm-1. The peaks in and around 2900cm -1 shows various stretching modes of C-Hn (n=1,2,3).

UR - http://www.scopus.com/inward/record.url?scp=80052510050&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=80052510050&partnerID=8YFLogxK

U2 - 10.1063/1.3605921

DO - 10.1063/1.3605921

M3 - Conference contribution

AN - SCOPUS:80052510050

SN - 9780735409057

VL - 1349

SP - 435

EP - 436

BT - Solid State Physics - Proceedings of the 55th DAE Solid State Physics Symposium 2010

T2 - 55th DAE Solid State Physics Symposium 2010

Y2 - 26 December 2010 through 30 December 2010

ER -

Fourier-transform infrared absorption study of the nanocluster carbon thin films grown using cathodic arc process

Abstract

Conference

All Science Journal Classification (ASJC) codes

Access to Document

Other files and links

Fingerprint

Cite this