TY - GEN
T1 - Fourier-transform infrared absorption study of the nanocluster carbon thin films grown using cathodic arc process
AU - De, Shounak
AU - Satyanarayana, B. S.
AU - Sharma, Shailesh
AU - Rao, K. Mohan
PY - 2011
Y1 - 2011
N2 - Nanocluster carbon thin films are deposited on Silicon Substrate using Cathodic Arc process. These films are mixed phased materials containing both sp2 and sp3 bondings. The surface morphology is characterized by Fourier-Transform Infrared Spectroscopy (FTIR) to find out different vibrational modes in these films. The various bendings modes with Olefinic and aromatic structures are associated with a broad absorption band between 1130 and 1550cm-1. The peaks in and around 2900cm -1 shows various stretching modes of C-Hn (n=1,2,3).
AB - Nanocluster carbon thin films are deposited on Silicon Substrate using Cathodic Arc process. These films are mixed phased materials containing both sp2 and sp3 bondings. The surface morphology is characterized by Fourier-Transform Infrared Spectroscopy (FTIR) to find out different vibrational modes in these films. The various bendings modes with Olefinic and aromatic structures are associated with a broad absorption band between 1130 and 1550cm-1. The peaks in and around 2900cm -1 shows various stretching modes of C-Hn (n=1,2,3).
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U2 - 10.1063/1.3605921
DO - 10.1063/1.3605921
M3 - Conference contribution
AN - SCOPUS:80052510050
SN - 9780735409057
VL - 1349
T3 - AIP Conference Proceedings
SP - 435
EP - 436
BT - Solid State Physics - Proceedings of the 55th DAE Solid State Physics Symposium 2010
T2 - 55th DAE Solid State Physics Symposium 2010
Y2 - 26 December 2010 through 30 December 2010
ER -