Abstract
Nanocluster carbon thin films are deposited on Silicon Substrate using Cathodic Arc process. These films are mixed phased materials containing both sp2 and sp3 bondings. The surface morphology is characterized by Fourier-Transform Infrared Spectroscopy (FTIR) to find out different vibrational modes in these films. The various bendings modes with Olefinic and aromatic structures are associated with a broad absorption band between 1130 and 1550cm-1. The peaks in and around 2900cm -1 shows various stretching modes of C-Hn (n=1,2,3).
Original language | English |
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Title of host publication | Solid State Physics - Proceedings of the 55th DAE Solid State Physics Symposium 2010 |
Pages | 435-436 |
Number of pages | 2 |
Volume | 1349 |
Edition | PART A |
DOIs | |
Publication status | Published - 2011 |
Event | 55th DAE Solid State Physics Symposium 2010 - Manipal, India Duration: 26-12-2010 → 30-12-2010 |
Conference
Conference | 55th DAE Solid State Physics Symposium 2010 |
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Country/Territory | India |
City | Manipal |
Period | 26-12-10 → 30-12-10 |
All Science Journal Classification (ASJC) codes
- Physics and Astronomy(all)