FTIR Spectroscopic Characterization of Crystallinity and Bond Rearrangement in Metal Doped V₂O₅Films

This paper focuses on assessing the role of Sn doping in modifying V2O5 thin films through Fourier Transform Infrared (FTIR) spectral analysis. V2O5 thin films doped with 0 wt% (undoped), 1 wt%, 2 wt% and 7 wt% Sn doping labeled as VSn0, VSn1, VSn2 and VSn7 respectively. For VSn0, VSn1, VSn2, and VSn7, the V-O-V bending mode was seen at 486 cm-1, 489 cm-1, 490 cm-1, and 498 cm-1, respectively. In VSn7 alone, a wide band at 573 cm-1 was seen. For VSn0, VSn1, VSn2, and VSn7, the V-O-V asymmetric stretching mode was detected at 747 cm-1, 757 cm-1, 765 cm-1, and 774 cm-1, respectively. The V=O terminal stretching mode appeared at a wavenumber of 896 cm-1 for Vsn0, shifted to 904 cm-1 for VSn1 and VSn2, and returned to 896 cm-1 for VSn7. At 1419 cm-1 for VSn2, a vanadate stretching mode emerged, and for VSn7, it moved to 1429 cm-1. The C=O and C-H stretching vibrations were not present in any of the Sn-doped samples, but they were detected in VSn0 at 1735 cm-1 and 2922 cm-1, respectively.