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Handling Missing Data in the Iris Dataset: Imputation Techniques and Their Effects on Model Accuracy

  • Vikash K. Agrawal*
  • , Srinivas Rao Bogireddy
  • , Haritha Murari
  • , Lalit N. Patil
  • , Vikas S. Panwar
  • , Yashraj M. Patil
  • *Corresponding author for this work

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Abstract

    This research examines the dataset from Iris to estimate the sepal lengths for iris blooms utilizing other characteristics including sepal breadth, petal duration, and petal wide. To forecast sepal dimension, linear regression approach has been developed and assessed using metrics including MSE, RMSE, MAE, and R-squared (R2). Studies show a significant relationship between both dependent as well as independent factors, allowing reliable predictions of sepal lengths. The model achieved an R2 score of 75.88%, demonstrating a strong ability to explain the variance in the dependent variable. The slightly lower Adjusted R2 value of 75.04% highlights the model's capacity to preserve a good fit while accounting for and penalizing the inclusion of unnecessary variables that do not significantly enhance its performance.

    Original languageEnglish
    Title of host publication2025 Global Conference in Emerging Technology, GINOTECH 2025
    PublisherInstitute of Electrical and Electronics Engineers Inc.
    ISBN (Electronic)9798331507756
    DOIs
    Publication statusPublished - 2025
    Event2025 IEEE International Global Conference in Emerging Technology, GINOTECH 2025 - Pune, India
    Duration: 09-05-202511-05-2025

    Publication series

    Name2025 Global Conference in Emerging Technology, GINOTECH 2025

    Conference

    Conference2025 IEEE International Global Conference in Emerging Technology, GINOTECH 2025
    Country/TerritoryIndia
    CityPune
    Period09-05-2511-05-25

    All Science Journal Classification (ASJC) codes

    • Computer Science Applications
    • Artificial Intelligence
    • Computer Graphics and Computer-Aided Design
    • Electrical and Electronic Engineering

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