Heterogeneity of photoluminescence properties and electronic transitions in copper oxide thin films: A thickness dependent structural and optical study

Engineering & Materials Science

• Photoluminescence 100%
• Copper oxides 88%
• Oxide films 76%
• Thin films 58%
• Optical band gaps 20%
• Optical constants 18%
• Porosity 17%
• Reactive sputtering 16%
• Diffraction patterns 14%
• Magnetron sputtering 13%
• Refractive index 13%
• Optical properties 12%
• Thick films 12%
• Structural properties 11%
• X ray diffraction 10%
• Particle size 9%
• Glass 8%
• Substrates 7%

Chemical Compounds

• Copper Oxide 67%
• Electronic Transition 65%
• Heterogeneity 57%
• Photoluminescence 47%
• Liquid Film 29%
• Optical Constant 12%
• Porosity 10%
• Magnetron Sputtering 10%
• Photoluminescence Spectrum 8%
• Glass Substrate 8%
• Refractive Index 8%
• Disorder 7%
• Band Gap 6%
• Optical Property 6%
• Absorption Spectrum 6%
• Strain 6%
• X-Ray Diffraction 4%
• Surface 2%