Introduction to Atomic Force Microscope: Basic Concepts and Applications

Aishwarya Joshi; Gaurang Patel; Sanjay Singh

doi:10.4324/9781003120995-21

Introduction to Atomic Force Microscope: Basic Concepts and Applications

Aishwarya Joshi, Gaurang Patel, Sanjay Singh^*

^*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Chapter

Original language	English
Title of host publication	Forensic Microscopy
Subtitle of host publication	Truth Under the Lenses
Publisher	Taylor and Francis Inc.
Pages	271-294
Number of pages	24
ISBN (Electronic)	9781000600148
ISBN (Print)	9780367638535
DOIs	https://doi.org/10.4324/9781003120995-21
Publication status	Published - 01-01-2022

All Science Journal Classification (ASJC) codes

General Social Sciences
General Physics and Astronomy

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10.4324/9781003120995-21

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BT - Forensic Microscopy

PB - Taylor and Francis Inc.

ER -

Introduction to Atomic Force Microscope: Basic Concepts and Applications

All Science Journal Classification (ASJC) codes

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