Introduction to Atomic Force Microscope: Basic Concepts and Applications

Aishwarya Joshi, Gaurang Patel, Sanjay Singh

Research output: Chapter in Book/Report/Conference proceedingChapter

Original languageEnglish
Title of host publicationForensic Microscopy
Subtitle of host publicationTruth Under the Lenses
PublisherTaylor and Francis Inc.
Number of pages24
ISBN (Electronic)9781000600148
ISBN (Print)9780367638535
Publication statusPublished - 01-01-2022

All Science Journal Classification (ASJC) codes

  • Social Sciences(all)
  • Physics and Astronomy(all)

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