Introduction to Atomic Force Microscope: Basic Concepts and Applications

Aishwarya Joshi; Gaurang Patel; Sanjay Singh

doi:10.4324/9781003120995-21

Introduction to Atomic Force Microscope: Basic Concepts and Applications

Aishwarya Joshi, Gaurang Patel, Sanjay Singh^*

^*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Chapter

Original language	English
Title of host publication	Forensic Microscopy
Subtitle of host publication	Truth Under the Lenses
Publisher	Taylor and Francis Inc.
Pages	271-294
Number of pages	24
ISBN (Electronic)	9781000600148
ISBN (Print)	9780367638535
DOIs	https://doi.org/10.4324/9781003120995-21
Publication status	Published - 01-01-2022

All Science Journal Classification (ASJC) codes

General Social Sciences
General Physics and Astronomy

Access to Document

10.4324/9781003120995-21

Cite this

@inbook{e8e24b0b0cc1488b9873b93db2d5e73f,

title = "Introduction to Atomic Force Microscope: Basic Concepts and Applications",

author = "Aishwarya Joshi and Gaurang Patel and Sanjay Singh",

year = "2022",

month = jan,

day = "1",

doi = "10.4324/9781003120995-21",

language = "English",

isbn = "9780367638535",

pages = "271--294",

booktitle = "Forensic Microscopy",

publisher = "Taylor and Francis Inc.",

address = "United States",

}

TY - CHAP

T1 - Introduction to Atomic Force Microscope

T2 - Basic Concepts and Applications

AU - Joshi, Aishwarya

AU - Patel, Gaurang

AU - Singh, Sanjay

PY - 2022/1/1

Y1 - 2022/1/1

UR - https://www.scopus.com/pages/publications/85160479949

UR - https://www.scopus.com/inward/citedby.url?scp=85160479949&partnerID=8YFLogxK

U2 - 10.4324/9781003120995-21

DO - 10.4324/9781003120995-21

M3 - Chapter

AN - SCOPUS:85160479949

SN - 9780367638535

SP - 271

EP - 294

BT - Forensic Microscopy

PB - Taylor and Francis Inc.

ER -

Introduction to Atomic Force Microscope: Basic Concepts and Applications

All Science Journal Classification (ASJC) codes

Access to Document

Other files and links

Cite this