Investigation of L-shell fluorescence emission in 42 ≤ Z ≤ 83 elements using reflection geometry and low energetic Au L X-rays

This study focuses on L-shell X-ray fluorescence analysis of elements with 42≤Z ≤ 83. The fluorescence L-X-rays were measured using Si-PIN detector in reflection geometry with low energetic Au L-X-ray incidence. Fluorescence cross sections and yields were estimated from the measured data. The findings help in improving quantitative XRF analysis techniques and refining theoretical models of L-shell fluorescence production. Intensity ratio of each emitted X-ray line with respect to L_α is calculated and theoretically estimated. The results were compared with the theoretical and experimental data in the available literature. The observed deviations underscore the complexity of electronic transitions in this energy range.