Abstract
In this study, Au-Lα characteristic X-rays are employed to excite K shell electrons of elements Cr, Mn, Fe, Co, Ni, Cu, and Zn. A reflection geometry setup is utilized, and counts are recorded using a Si-PIN detector with enough time for a statistical standard deviation of 10 %. From the spectra of counts versus energy, fluorescence parameters, including K shell fluorescence yield, cross section, intensity ratio, and K to L vacancy transfer probability are computed. These values are then compared with existing experimental and theoretical data to evaluate their accuracy and consistency.
| Original language | English |
|---|---|
| Article number | 112859 |
| Journal | Radiation Physics and Chemistry |
| Volume | 235 |
| DOIs | |
| Publication status | Published - 10-2025 |
All Science Journal Classification (ASJC) codes
- Radiation
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