TY - GEN
T1 - Leaf Disease Detection and Prevention using Deep Learning
AU - Anu, H.
AU - Yogeshwary, B. H.
AU - Yashwanth, N.
N1 - Publisher Copyright:
© 2022 IEEE.
PY - 2022
Y1 - 2022
N2 - Crop disease is a major factor in the agriculture sector. To get great quality and quantity of crop, checking on the plant condition is the most important factor. Identifying the problems with a solution at an early stage is very important. So, a deep-learning-based project which it leads to detecting leaf disease is forwarded to the CNN algorithm. The available dataset which contains lots of images based on a different plant to find out the type of disease the plant has and also create a Robot that is capable of spraying the right pesticide on the diseased plant to avoid the further spread of the disease is used. The agenda is to come up with a better yield in the future stages.
AB - Crop disease is a major factor in the agriculture sector. To get great quality and quantity of crop, checking on the plant condition is the most important factor. Identifying the problems with a solution at an early stage is very important. So, a deep-learning-based project which it leads to detecting leaf disease is forwarded to the CNN algorithm. The available dataset which contains lots of images based on a different plant to find out the type of disease the plant has and also create a Robot that is capable of spraying the right pesticide on the diseased plant to avoid the further spread of the disease is used. The agenda is to come up with a better yield in the future stages.
UR - https://www.scopus.com/pages/publications/85150681021
UR - https://www.scopus.com/inward/citedby.url?scp=85150681021&partnerID=8YFLogxK
U2 - 10.1109/AIDE57180.2022.10060181
DO - 10.1109/AIDE57180.2022.10060181
M3 - Conference contribution
AN - SCOPUS:85150681021
T3 - International Conference on Artificial Intelligence and Data Engineering, AIDE 2022
SP - 223
EP - 229
BT - International Conference on Artificial Intelligence and Data Engineering, AIDE 2022
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2022 International Conference on Artificial Intelligence and Data Engineering, AIDE 2022
Y2 - 22 December 2022 through 23 December 2022
ER -