Life estimation of high power LED using distribution based reliability analysis

Prathvi Nayak; Anjan N  Padmasali; Savitha G. Kini

doi:10.1109/RTEICT.2017.8256874

Life estimation of high power LED using distribution based reliability analysis

Prathvi Nayak, Anjan N Padmasali, Savitha G. Kini

Department of Electrical and Electronics Engineering, Manipal Institute of Technology, Manipal

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

1 Citation (Scopus)

Abstract

Light Emitting Diodes (LEDs) are highly preferred light sources due to their high luminous efficacy, energy efficiency, physical robustness and life. Technological developments in the recent years have almost replaced conventional light sources with light emitting diodes in many applications such as hospital lighting, street lighting, theater lighting and other general illumination purpose. The reliability and performance of the LEDs are affected by the junction temperature, as it reduces the lumen output over time. This paper uses the lumen maintenance data provided by a high power LED to analyze the degradation path and determination of life time using pseudo failure time and random effect parameter. With the help of statistical models (Normal, Lognormal and Weibull) the reliability and lifetime of the LED based on lumen degradation are predicted. And using a method called Akaike Information Criterion (AIC), the best model is chosen. Validation of the model is carried out using regression analysis. Reliability modeling using these methods result in high correlative coefficient and less error.

Original language	English
Title of host publication	RTEICT 2017 - 2nd IEEE International Conference on Recent Trends in Electronics, Information and Communication Technology, Proceedings
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	1626-1631
Number of pages	6
Volume	2018-January
ISBN (Electronic)	9781509037049
DOIs	https://doi.org/10.1109/RTEICT.2017.8256874
Publication status	Published - 12-01-2018
Event	2nd IEEE International Conference on Recent Trends in Electronics, Information and Communication Technology, RTEICT 2017 - Bangalore, India Duration: 19-05-2017 → 20-05-2017

Conference

Conference	2nd IEEE International Conference on Recent Trends in Electronics, Information and Communication Technology, RTEICT 2017
Country/Territory	India
City	Bangalore
Period	19-05-17 → 20-05-17

All Science Journal Classification (ASJC) codes

Computer Networks and Communications
Computer Science Applications
Media Technology
Control and Optimization
Instrumentation
Transportation
Communication

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

Access to Document

10.1109/RTEICT.2017.8256874

Cite this

Nayak, P., Padmasali, A. N., & Kini, S. G. (2018). Life estimation of high power LED using distribution based reliability analysis. In RTEICT 2017 - 2nd IEEE International Conference on Recent Trends in Electronics, Information and Communication Technology, Proceedings (Vol. 2018-January, pp. 1626-1631). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/RTEICT.2017.8256874

@inproceedings{2f369c975b6e496daba4918d5aff3321,

title = "Life estimation of high power LED using distribution based reliability analysis",

abstract = "Light Emitting Diodes (LEDs) are highly preferred light sources due to their high luminous efficacy, energy efficiency, physical robustness and life. Technological developments in the recent years have almost replaced conventional light sources with light emitting diodes in many applications such as hospital lighting, street lighting, theater lighting and other general illumination purpose. The reliability and performance of the LEDs are affected by the junction temperature, as it reduces the lumen output over time. This paper uses the lumen maintenance data provided by a high power LED to analyze the degradation path and determination of life time using pseudo failure time and random effect parameter. With the help of statistical models (Normal, Lognormal and Weibull) the reliability and lifetime of the LED based on lumen degradation are predicted. And using a method called Akaike Information Criterion (AIC), the best model is chosen. Validation of the model is carried out using regression analysis. Reliability modeling using these methods result in high correlative coefficient and less error.",

author = "Prathvi Nayak and Padmasali, {Anjan N} and Kini, {Savitha G.}",

year = "2018",

month = jan,

day = "12",

doi = "10.1109/RTEICT.2017.8256874",

language = "English",

volume = "2018-January",

pages = "1626--1631",

booktitle = "RTEICT 2017 - 2nd IEEE International Conference on Recent Trends in Electronics, Information and Communication Technology, Proceedings",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

address = "United States",

note = "2nd IEEE International Conference on Recent Trends in Electronics, Information and Communication Technology, RTEICT 2017 ; Conference date: 19-05-2017 Through 20-05-2017",

}

Nayak, P, Padmasali, AN & Kini, SG 2018, Life estimation of high power LED using distribution based reliability analysis. in RTEICT 2017 - 2nd IEEE International Conference on Recent Trends in Electronics, Information and Communication Technology, Proceedings. vol. 2018-January, Institute of Electrical and Electronics Engineers Inc., pp. 1626-1631, 2nd IEEE International Conference on Recent Trends in Electronics, Information and Communication Technology, RTEICT 2017, Bangalore, India, 19-05-17. https://doi.org/10.1109/RTEICT.2017.8256874

Life estimation of high power LED using distribution based reliability analysis. / Nayak, Prathvi; Padmasali, Anjan N ; Kini, Savitha G.
RTEICT 2017 - 2nd IEEE International Conference on Recent Trends in Electronics, Information and Communication Technology, Proceedings. Vol. 2018-January Institute of Electrical and Electronics Engineers Inc., 2018. p. 1626-1631.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

TY - GEN

T1 - Life estimation of high power LED using distribution based reliability analysis

AU - Nayak, Prathvi

AU - Padmasali, Anjan N

AU - Kini, Savitha G.

PY - 2018/1/12

Y1 - 2018/1/12

N2 - Light Emitting Diodes (LEDs) are highly preferred light sources due to their high luminous efficacy, energy efficiency, physical robustness and life. Technological developments in the recent years have almost replaced conventional light sources with light emitting diodes in many applications such as hospital lighting, street lighting, theater lighting and other general illumination purpose. The reliability and performance of the LEDs are affected by the junction temperature, as it reduces the lumen output over time. This paper uses the lumen maintenance data provided by a high power LED to analyze the degradation path and determination of life time using pseudo failure time and random effect parameter. With the help of statistical models (Normal, Lognormal and Weibull) the reliability and lifetime of the LED based on lumen degradation are predicted. And using a method called Akaike Information Criterion (AIC), the best model is chosen. Validation of the model is carried out using regression analysis. Reliability modeling using these methods result in high correlative coefficient and less error.

AB - Light Emitting Diodes (LEDs) are highly preferred light sources due to their high luminous efficacy, energy efficiency, physical robustness and life. Technological developments in the recent years have almost replaced conventional light sources with light emitting diodes in many applications such as hospital lighting, street lighting, theater lighting and other general illumination purpose. The reliability and performance of the LEDs are affected by the junction temperature, as it reduces the lumen output over time. This paper uses the lumen maintenance data provided by a high power LED to analyze the degradation path and determination of life time using pseudo failure time and random effect parameter. With the help of statistical models (Normal, Lognormal and Weibull) the reliability and lifetime of the LED based on lumen degradation are predicted. And using a method called Akaike Information Criterion (AIC), the best model is chosen. Validation of the model is carried out using regression analysis. Reliability modeling using these methods result in high correlative coefficient and less error.

UR - http://www.scopus.com/inward/record.url?scp=85046261004&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85046261004&partnerID=8YFLogxK

U2 - 10.1109/RTEICT.2017.8256874

DO - 10.1109/RTEICT.2017.8256874

M3 - Conference contribution

VL - 2018-January

SP - 1626

EP - 1631

BT - RTEICT 2017 - 2nd IEEE International Conference on Recent Trends in Electronics, Information and Communication Technology, Proceedings

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 2nd IEEE International Conference on Recent Trends in Electronics, Information and Communication Technology, RTEICT 2017

Y2 - 19 May 2017 through 20 May 2017

ER -

Nayak P, Padmasali AN , Kini SG. Life estimation of high power LED using distribution based reliability analysis. In RTEICT 2017 - 2nd IEEE International Conference on Recent Trends in Electronics, Information and Communication Technology, Proceedings. Vol. 2018-January. Institute of Electrical and Electronics Engineers Inc. 2018. p. 1626-1631 doi: 10.1109/RTEICT.2017.8256874

Life estimation of high power LED using distribution based reliability analysis

Abstract

Conference

All Science Journal Classification (ASJC) codes

UN SDGs

Access to Document

Other files and links

Fingerprint

Cite this