Low energy x-ray photons induced changes in lexan films

P. M. Raveesha; K. Hareesh; V. P. Dhamgaye; S. D. Dhole; Ganesh Sanjeev

Low energy x-ray photons induced changes in lexan films

P. M. Raveesha, K. Hareesh, V. P. Dhamgaye, S. D. Dhole, Ganesh Sanjeev

Department of Physics, Manipal Institute of Technology, Bengaluru

Research output: Contribution to journal › Article › peer-review

Abstract

40 keV Synchrotron X-ray photons were made to fall on Lexan polycarbonate films at different exposure time. The low energy X-ray photons assisted modification in terms of physico-chemical properties of Lexan films were studied using Fourier Transform Infrared (FTIR) spectrophotometer, X-Ray Diffractogram (XRD), Vicker’s Microhardness Tester, Scanning Electron Microscope (SEM) and Contact Angle Meter. FTIR result mainly includes decrease in the C=C stretching and C-C stretching of aromatics after irradiation. XRD analysis shows a slight decrease in the crystallinity after irradiation. Vicker’s microhardness test reveals the decrement in microhardness of Lexan films after irradiation. SEM result shows irradiation induced changes in the surface morphology. Contact angle measurement shows increase in the water contact angle in irradiated Lexan films.

Original language	English
Pages (from-to)	706-710
Number of pages	5
Journal	Indian Journal of Pure and Applied Physics
Volume	59
Issue number	10
Publication status	Published - 10-2021

All Science Journal Classification (ASJC) codes

Physics and Astronomy (miscellaneous)

Cite this

@article{7a300bd099264a41bb0266eb9e028f4c,

title = "Low energy x-ray photons induced changes in lexan films",

abstract = "40 keV Synchrotron X-ray photons were made to fall on Lexan polycarbonate films at different exposure time. The low energy X-ray photons assisted modification in terms of physico-chemical properties of Lexan films were studied using Fourier Transform Infrared (FTIR) spectrophotometer, X-Ray Diffractogram (XRD), Vicker{\textquoteright}s Microhardness Tester, Scanning Electron Microscope (SEM) and Contact Angle Meter. FTIR result mainly includes decrease in the C=C stretching and C-C stretching of aromatics after irradiation. XRD analysis shows a slight decrease in the crystallinity after irradiation. Vicker{\textquoteright}s microhardness test reveals the decrement in microhardness of Lexan films after irradiation. SEM result shows irradiation induced changes in the surface morphology. Contact angle measurement shows increase in the water contact angle in irradiated Lexan films.",

author = "Raveesha, {P. M.} and K. Hareesh and Dhamgaye, {V. P.} and Dhole, {S. D.} and Ganesh Sanjeev",

note = "Funding Information: The work is carried out under the financial support of BRNS (No.34/14/73/2014-BRNS/10493 dated 17.06.2015). Publisher Copyright: {\textcopyright} 2021 National Institute of Science Communication and Information Resources (NISCAIR). All rights reserved.",

year = "2021",

month = oct,

language = "English",

volume = "59",

pages = "706--710",

journal = "Indian Journal of Pure and Applied Physics",

issn = "0019-5596",

publisher = "National Institute of Science Communication and Information Resources (NISCAIR)",

number = "10",

}

TY - JOUR

T1 - Low energy x-ray photons induced changes in lexan films

AU - Raveesha, P. M.

AU - Hareesh, K.

AU - Dhamgaye, V. P.

AU - Dhole, S. D.

AU - Sanjeev, Ganesh

N1 - Funding Information: The work is carried out under the financial support of BRNS (No.34/14/73/2014-BRNS/10493 dated 17.06.2015). Publisher Copyright: © 2021 National Institute of Science Communication and Information Resources (NISCAIR). All rights reserved.

PY - 2021/10

Y1 - 2021/10

N2 - 40 keV Synchrotron X-ray photons were made to fall on Lexan polycarbonate films at different exposure time. The low energy X-ray photons assisted modification in terms of physico-chemical properties of Lexan films were studied using Fourier Transform Infrared (FTIR) spectrophotometer, X-Ray Diffractogram (XRD), Vicker’s Microhardness Tester, Scanning Electron Microscope (SEM) and Contact Angle Meter. FTIR result mainly includes decrease in the C=C stretching and C-C stretching of aromatics after irradiation. XRD analysis shows a slight decrease in the crystallinity after irradiation. Vicker’s microhardness test reveals the decrement in microhardness of Lexan films after irradiation. SEM result shows irradiation induced changes in the surface morphology. Contact angle measurement shows increase in the water contact angle in irradiated Lexan films.

AB - 40 keV Synchrotron X-ray photons were made to fall on Lexan polycarbonate films at different exposure time. The low energy X-ray photons assisted modification in terms of physico-chemical properties of Lexan films were studied using Fourier Transform Infrared (FTIR) spectrophotometer, X-Ray Diffractogram (XRD), Vicker’s Microhardness Tester, Scanning Electron Microscope (SEM) and Contact Angle Meter. FTIR result mainly includes decrease in the C=C stretching and C-C stretching of aromatics after irradiation. XRD analysis shows a slight decrease in the crystallinity after irradiation. Vicker’s microhardness test reveals the decrement in microhardness of Lexan films after irradiation. SEM result shows irradiation induced changes in the surface morphology. Contact angle measurement shows increase in the water contact angle in irradiated Lexan films.

UR - http://www.scopus.com/inward/record.url?scp=85117026440&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85117026440&partnerID=8YFLogxK

M3 - Article

AN - SCOPUS:85117026440

SN - 0019-5596

VL - 59

SP - 706

EP - 710

JO - Indian Journal of Pure and Applied Physics

JF - Indian Journal of Pure and Applied Physics

IS - 10

ER -

Low energy x-ray photons induced changes in lexan films

Abstract

All Science Journal Classification (ASJC) codes

Other files and links

Fingerprint

Cite this