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Low Power CMOS-MEMS nN Force Sensor using Force-Enabled Resistive Load Inverter (FERI)

Research output: Contribution to journalArticlepeer-review

Abstract

This paper presents an N-bit nano-Newton (nN) MEMS force sensor that delivers a digital output, enabling direct integration with digital processors without needing an analog front-end. This design significantly reduces the power consumption of the sensor and its associated read-out circuitry in modern smart devices. The sensor has an array of Parylene-C cantilever-based Force-Enabled Resistive Inverters (FERIs), with a Force-Enabled Field-Effect Transistor (FE-FET) acting as the driver transistor. Each cantilever is designed to detect a specific force, with a metal strip attached to the cantilever tip. The cantilever is placed above a resistive load inverter, where the drain of the FE-FET and the load resistor (RL) are not connected through permanent contact, resulting in a logic ‘1’ output (VOi = VDD). With an external stimulus such as force, the cantilever deforms and the drain of FE-FET connected to a resistor through the cantilever tip, pulling the output voltage to logic ‘0’ (VOi = 0, i is the switch number). The sensor is designed to detect forces in the range of 0 to 1 μN with a resolution of 100nN (F1). In the absence of an input force, the status of S1-S10 is 1111111111, which changes to 0000000000 with a 1 μN force. The FE-FET in FERI exhibits low leakage current, achieving an on/off current ratio of approximately 1010 between input force Fi ≥ iF1 (on) and Fi < iF1 (off). This ensures a strong logic ‘1’ at the output with negligible leakage current when the switch is not operating thereby eliminating the reduced logic ‘1’ problem inherent to resistive-load inverters.The sensor achieves an average DC power dissipation (PDC) of 0.4 mW. The simulations were performed using COMSOL Multiphysics, Sentaurus TCAD, and Cadence Virtuoso, incorporating a Verilog-A–based look-up-table (LUT) methodology to accurately capture process variations and device behavior. A feasible fabrication process integration is demonstrated to realize CMOS-MEMS nN-FERI-based force sensor.

Original languageEnglish
Pages (from-to)9660-9665
Number of pages6
JournalIEEE Sensors Journal
Volume26
Issue number7
DOIs
Publication statusAccepted/In press - 2026

All Science Journal Classification (ASJC) codes

  • Instrumentation
  • Electrical and Electronic Engineering

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