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Methodical tuning of NH3 gas sensing in WO3 thin films by electron beam irradiation

  • Anusha
  • , Priyanka Kumari
  • , Aninamol Ani
  • , P. Poornesh*
  • , Saikat Chattopadhyay
  • , Vikash Chandra Petwal
  • , Vijay Pal Verma
  • , Jishnu Dwivedi
  • *Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

Abstract

The present work focuses on the structure, morphology, optical and sensing analysis of Electron Beam Irradiation (EBI) treated WO3 films synthesized by the spray pyrolysis technique. X-ray diffraction (XRD) revealed a slight shift in the 2θ position, indicating stress generated due to EBI process. Scanning Electron Microscopy (SEM) morphographs presented well-defined grains at higher irradiation dosages. X-ray Photoelectron Spectroscopy (XPS) studies showed increased oxygen vacancy defects for the 5 kGy treated sample compared to unirradiated WO3. Sensing analysis of unirradiated and EBI-treated films was conducted towards ammonia (NH3) at an optimum operating temperature of 200 °C. Sensor response of 5 kGy treated film increased by − 4.5 fold compared to unirradiated film at 5 ppm NH3 concentration. The current study demonstrates the importance of EBI in tailoring the NH3 sensing properties of WO3 films.

Original languageEnglish
Article number318
JournalJournal of Materials Science: Materials in Electronics
Volume35
Issue number5
DOIs
Publication statusPublished - 02-2024

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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