Abstract
Polycrystalline Zn1-xFexO (x = 0.0–0.05) thin films were prepared on an amorphous glass substrate using a chemical method. Various characteristics of the films were analyzed through different characterization techniques, including X-ray diffraction (XRD), Raman spectroscopy, UV–Vis spectroscopy, photoluminescence (PL), scanning electron microscopy (SEM), energy dispersive X-ray analysis (EDAX), and two-probe methods. The structural characterization confirmed the quality of the films, which were free from any secondary phases. The surface topography was disrupted after the introduction of the Fe ions. Optical studies indicated that the prepared samples were highly transparent, with the bandgap values changing owing to the introduction of energy levels between the conduction bands and valence bands caused by the inclusion of Fe dopant. The samples exhibited ultraviolet, visible and near-infrared (IR) emission, and the resistance of the films increased with doping due to increased grain boundaries caused by a reduction in crystallite size.
| Original language | English |
|---|---|
| Article number | 417617 |
| Journal | Physica B: Condensed Matter |
| Volume | 715 |
| DOIs | |
| Publication status | Published - 15-10-2025 |
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Electrical and Electronic Engineering
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