Abstract
Nanostructured Zn1−xMgxO (x = 0–0.04) thin films were deposited on a glass substrate through the sol–gel dip coating. X-ray diffraction indicates the films exhibited a hexagonal wurtzite structure with maximum intensity at (1 0 1) plane. The intensity of the diffraction peak decreased with increasing the Mg doping concentration. The crystallite size varied as a function of the increase in Mg doping concentration. The deposits showed a nanograin structure for pure ZnO, which changes in the presence of Mg content, and elemental composition was confirmed by using energy-dispersive spectra. Optical analysis showed a significant increase in transmittance from 80 to 90% in the visible range and a decrement in the optical bandgap energy from 3.305 to 3.261 eV with an increase in Mg doping. Photoluminescence spectra showed there was a quenching of near band edge emission with doping concentration and a red emission for Zn0.96Mg0.04O film. The color coordinates of the deposits were in the nearly white light region, showing the maximal white light emission.
| Original language | English |
|---|---|
| Article number | 624 |
| Journal | Journal of Materials Science: Materials in Electronics |
| Volume | 34 |
| Issue number | 7 |
| DOIs | |
| Publication status | Published - 03-2023 |
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics
- Condensed Matter Physics
- Electrical and Electronic Engineering
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