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Nonlinear optical and optical power limiting studies of Zn1-xMnxO thin films prepared by spray pyrolysis

  • H. S. Sindhu
  • , Shivaraj R. Maidur
  • , Parutagouda Shankaragouda Patil
  • , R. J. Choudhary
  • , B. V. Rajendra*
  • *Corresponding author for this work

    Research output: Contribution to journalArticlepeer-review

    Abstract

    Zn1-xMnxO (x = 0, 0.02, 0.04, 0.06, 0.08 and 0.1) thin films were deposited at 723 K temperature on glass substrate using a solution of molarity of 0.0125 M through spray pyrolysis method. X-ray diffractogram (XRD) analysis confirmed that all the films have (0 0 2) as a preferential orientation with hexagonal wurtzite structure. The increase of dopant marginally changed the crystallite size and lattice parameters. Surface morphology changes fibrous to spherical structure with an increase in doping. X-ray photoelectron spectroscope (XPS) measurements proved the occurrence of manganese is in the Mn2+ transition state along with Oxygen and Zinc content. The films showed ˜90-80% transmittance in the visible region with increasing in Mn concentration. The energy band-gap reduced with increase in dopant, due to sp-d exchange interactions. The nonlinear optical (NLO) properties were studied using z-scan technique under continuous wave (CW) diode pumped solid-state (DPSS) laser operating at 532 nm wavelength. Reverse saturable absorption (RSA) behaviors observed in both undoped and Mn doped films which is attributed to two-photon absorption (TPA) process. The optical limiting properties were also studied, which suggests that the prepared thin films could be used as optical limiters in the visible region.

    Original languageEnglish
    Pages (from-to)671-681
    Number of pages11
    JournalOptik
    Volume182
    DOIs
    Publication statusPublished - 01-04-2019

    All Science Journal Classification (ASJC) codes

    • Electronic, Optical and Magnetic Materials
    • Atomic and Molecular Physics, and Optics
    • Electrical and Electronic Engineering

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