On-line recognition and retrieval of pd signal by regularity measurement based on computation of lipschitz exponents in wavelet domain

Pradeep Kumar Shetty*, T. S. Ramu

*Corresponding author for this work

Research output: Contribution to journalConference articlepeer-review

1 Citation (Scopus)

Abstract

The problem of on-line recognition and retrieval of relatively weak industrial signal such as Partial Discharges (PD), buried in excessive noise has been addressed in this paper. The major bottleneck being the recognition and suppression of stochastic pulsive interference (PI), due to, overlapping broad band frequency spectrum of PI and PD pulses. Therefore, on-line, on-site, PD measurement is hardly possible in conventional frequency based DSP techniques. In Authors methodology, the observed noisy signal is enhanced and non-pulsive noises are removed by implementing a wavelet based soft-thresholding scheme. Then, the pulses are detected using simple peak-detector and further analysis is done on localized pulses by taking appropriate window at the detected location. The features of the PD and PI pulses are obtained by measuring the regularity of the pulses at the detected location, which is accomplished by estimating Lipschitz exponents (LE). In this regard, an wavelet based methodology has been used in estimating LE, which is then, used as a index for classifying the pulses in to PD and PI. The method proposed by the Authors were found to be effective in, automatic retrieval of PD pulses.

Original languageEnglish
Pages (from-to)426-429
Number of pages4
JournalAnnual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP
Publication statusPublished - 2004
Event2004 Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP - Boulder, CO, United States
Duration: 17-10-200420-10-2004

All Science Journal Classification (ASJC) codes

  • General Engineering

Fingerprint

Dive into the research topics of 'On-line recognition and retrieval of pd signal by regularity measurement based on computation of lipschitz exponents in wavelet domain'. Together they form a unique fingerprint.

Cite this