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Performance optimization of InSe-FETs using high-k dielectric materials for analog/RF applications

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Abstract

This study investigates the performance of Indium Selenide (InSe)-based field-effect transistors (FETs) incorporating high-k dielectric materials, using atomistic simulations based on the non-equilibrium Green’s function formalism. Initially, the effect of high-k dielectrics on the ON/OFF current ratio (ION/IOFF) is analyzed to assess their suitability for digital applications. Subsequently, key analog and radio-frequency (RF) performance metrics, such as intrinsic gain (AV), transconductance generation factor (TGF), and cut-off frequency (fT), are examined. The results demonstrate notable enhancements: transconductance (gm) increases by 98.3%, TGF by 73.7%, and AV by 72.66%. However, a 9.85% reduction in fT is observed, indicating a trade-off between gain and speed. These findings highlight the potential of high-k dielectric engineering in optimizing InSe-based FETs for next-generation analog and RF circuits.

Original languageEnglish
Article number9573
JournalScientific Reports
Volume16
Issue number1
DOIs
Publication statusPublished - 12-2026

All Science Journal Classification (ASJC) codes

  • General

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