TY - JOUR
T1 - Photoacoustic investigation of doped InP using open cell configuration
AU - George, Sajan D.
AU - Vallabhan, C. P G
AU - Heck, M.
AU - Radhakrishnan, P.
AU - Nampoori, V. P N
PY - 2002/1/1
Y1 - 2002/1/1
N2 - An open cell photoacoustic (PA) configuration has been employed to evaluate the thermal diffusivity of intrinsic InP as well as InP doped with tin and iron. Thermal diffusivity data have been evaluated from variation of phase of PA signal as a function of modulation frequency. In doped samples, we observe a reduced value for thermal diffusivity in comparison with intrinsic InP. We also observed that, while the phase of the PA signal varies linearly with the square root of chopping frequency for doped samples, the intrinsic material does not exhibit such behaviour in the experimental frequency range. These results have been interpreted in terms of the heat generation and phonon assisted heat diffusion mechanisms in semiconductors.
AB - An open cell photoacoustic (PA) configuration has been employed to evaluate the thermal diffusivity of intrinsic InP as well as InP doped with tin and iron. Thermal diffusivity data have been evaluated from variation of phase of PA signal as a function of modulation frequency. In doped samples, we observe a reduced value for thermal diffusivity in comparison with intrinsic InP. We also observed that, while the phase of the PA signal varies linearly with the square root of chopping frequency for doped samples, the intrinsic material does not exhibit such behaviour in the experimental frequency range. These results have been interpreted in terms of the heat generation and phonon assisted heat diffusion mechanisms in semiconductors.
UR - http://www.scopus.com/inward/record.url?scp=0037525024&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=0037525024&partnerID=8YFLogxK
U2 - 10.1080/10589750290034746
DO - 10.1080/10589750290034746
M3 - Article
AN - SCOPUS:0037525024
SN - 1058-9759
VL - 18
SP - 75
EP - 82
JO - Nondestructive Testing and Evaluation
JF - Nondestructive Testing and Evaluation
IS - 2
ER -