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Probe-based hyperspectral imager for crop monitoring

  • Maria Merin Antony
  • , C. S.Suchand Sandeep
  • , Murukeshan Vadakke Matham*
  • *Corresponding author for this work

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Abstract

    Automated crop monitoring techniques help in better management of growing conditions in order to improve quality and yield, and to reduce the impact on the environment. Various stages of a crop in its life cycle is noticeable with a change in its leaf color. The yellowing of leaf is considered as an important quality defect in green leafy vegetables. Yellowing is initiated at the end of maturity stage and continues in the senescence stage. Most of the methods used for monitoring leaf quality requires the detachment of the leaf from the plant, which is destructive in nature. Among the several nondestructive techniques available, hyperspectral imaging (HSI) modality offers the possibility to address this problem by monitoring the reflection spectrum of the leaf in situ. When the freshness of the leaf reduces, the chlorophyll content in the leaf decreases. This results in an increase in its reflectance in the visible region as the absorption of light by chlorophyll reduces. Hence, the reflection spectrum can be used as a measure for the freshness of the leaf. However, monitoring large areas usually require translation of the whole imaging system or removal of the leaf from the plant. In this context, we propose to use a flexible probe-based HSI system to mitigate these issues. We demonstrate the adoption of a probe based HSI modality to enable in situ live plant monitoring. The classification of the leaves from the HSI data is performed using principal component analysis (PCA) technique.

    Original languageEnglish
    Title of host publicationSPIE Future Sensing Technologies
    EditorsMasafumi Kimata, Joseph A. Shaw, Christopher R. Valenta
    PublisherSPIE
    ISBN (Electronic)9781510638617
    DOIs
    Publication statusPublished - 2020
    EventSPIE Future Sensing Technologies 2020 - Virtual, Online, Japan
    Duration: 09-11-202013-11-2020

    Publication series

    NameProceedings of SPIE - The International Society for Optical Engineering
    Volume11525
    ISSN (Print)0277-786X
    ISSN (Electronic)1996-756X

    Conference

    ConferenceSPIE Future Sensing Technologies 2020
    Country/TerritoryJapan
    CityVirtual, Online
    Period09-11-2013-11-20

    All Science Journal Classification (ASJC) codes

    • Electronic, Optical and Magnetic Materials
    • Condensed Matter Physics
    • Computer Science Applications
    • Applied Mathematics
    • Electrical and Electronic Engineering

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