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Reliability Assisted Electro-Physical Modelling of Radiation-Induced Resistance Fluctuation in Nanosheet FET

  • Khushi Jain
  • , Sandeep Kumar
  • , Sunil Rathore
  • , Shashank Banchhor
  • , Navjeet Bagga*
    • *Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

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