Risk Stratification of Neonates using Machine Learning Techniques

Rudresh D. Shirwaikar, U. Dinesh Acharya, Tanvi Parate, Leslie Edward Simon Lewis

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The process of classifying newly born babies into high-risk and low-risk is called risk stratification. Having a platform to stratify neonates according to severity of risk is the key to the success of any Neonatal Intensive Care Unit (NICU). The premature neonates are at a higher risk of developing the disabilities which could affect their future growth. However, the extent at which this can affect their entire life, strongly depends on how early they were born, the quality of care they received during and around birth and the days they follow in NICU. Establishing a decision support tool using machine learning algorithms will be useful for identifying neonates who are at high risk for proper diagnosis and efficient monitoring of neonates at NICU. The paper is focused on risk stratification of neonates using machine leaning algorithms such as Artificial Neural Network (ANN), K Nearest Neighbors (KNN) and Support Vector Machine (SVM). Furthermore, various evaluation parameters were used for comparing the results of the algorithms on the 66 cases of neonates admitted at Kasturba Medical College, Manipal. Based on Area Under Curve (AUC), ANN (0.91) performed better than KNN (0.83) and SVM (0.84). The result indicates the significant contribution of ANN with improved performance in identifying neonates who are at high risk better than other algorithms

Original languageEnglish
Title of host publication2020 IEEE International Conference on Distributed Computing, VLSI, Electrical Circuits and Robotics, DISCOVER 2020 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages74-78
Number of pages5
ISBN (Electronic)9781728198859
DOIs
Publication statusPublished - 30-10-2020
Event2020 IEEE International Conference on Distributed Computing, VLSI, Electrical Circuits and Robotics, DISCOVER 2020 - Udupi, India
Duration: 30-10-202031-10-2020

Publication series

Name2020 IEEE International Conference on Distributed Computing, VLSI, Electrical Circuits and Robotics, DISCOVER 2020 - Proceedings

Conference

Conference2020 IEEE International Conference on Distributed Computing, VLSI, Electrical Circuits and Robotics, DISCOVER 2020
Country/TerritoryIndia
CityUdupi
Period30-10-2031-10-20

All Science Journal Classification (ASJC) codes

  • Computer Science Applications
  • Computer Vision and Pattern Recognition
  • Hardware and Architecture
  • Electrical and Electronic Engineering
  • Control and Optimization
  • Artificial Intelligence
  • Computer Networks and Communications

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