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Role of Interfacial Oxide on Capacitance Matching in a Negative Capacitance FinFET: A Reliability Perspective
Rajeewa Kumar Jaisawal, Sunil Rathore, Pravin N. Kondekar, Shashank Kumar Banchhor, Navjeet Bagga
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
2
Citations
(Scopus)