Self-Heating and Interface Traps Assisted Early Aging Revelation and Reliability Analysis of Negative Capacitance FinFET

  • Rajeewa Kumar Jaisawal
  • , Sunil Rathore
  • , Navneet Gandhi
  • , P. N. Kondekar
  • , Shashank Banchhor
  • , V. Bharath Sreenivas
  • , Young Suh Song
  • , Navjeet Bagga

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

    21 Citations (Scopus)

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