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Sensing of ultra-ppm level NO2 gas via synergistic effects of Cr doping and e-beam irradiation in WO3 nanostructures

  • Anusha
  • , P. Poornesh*
  • , Vikash Chandra Petwal
  • , Vijay Pal Verma
  • , Jishnu Dwivedi
  • *Corresponding author for this work

    Research output: Contribution to journalArticlepeer-review

    Abstract

    Herein, we report the effects of Cr doping and electron beam irradiation (EBI) on WO3 thin films towards low-level detection of NO2. Structural, morphological, and defect correlations are presented to provide a comprehensive understanding of the film's properties. XRD and Raman analyses confirmed the formation of well-crystallized WO3 films due to doping and irradiation. Photoluminescence analysis validated the presence of oxygen vacancy (Vo) defects in the films which was further corroborated by XPS studies. The EBI Cr-WO3 film exhibited a higher concentration of Vo defects and smaller grain sizes, contributing to enhanced sensing performance. A maximum sensor response of 3.43 was achieved at an NO2 concentration of 5 ppm. Theoretical limit of detection (LOD) calculations indicated ultra-low NO2 detection capability at 0.4 ppm (400 ppb), highlighting the potential of the prepared film for applications in environmental monitoring, healthcare diagnostics, and industrial settings.

    Original languageEnglish
    Pages (from-to)5100-5113
    Number of pages14
    JournalMaterials Advances
    Volume6
    Issue number15
    DOIs
    Publication statusPublished - 28-07-2025

    All Science Journal Classification (ASJC) codes

    • Chemistry (miscellaneous)
    • General Materials Science

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