Similarity measurement of gene using arc tan function in gene ontology

K. Vengatesan; S. B. Mahajan; P. Sanjeevikumar; R. M. Kulkarni; Sana Moin

doi:10.1007/978-981-10-4765-7_83

Similarity measurement of gene using arc tan function in gene ontology

K. Vengatesan^*, S. B. Mahajan, P. Sanjeevikumar, R. M. Kulkarni, Sana Moin

^*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

The Gene Ontology (GO) is a technique that measures second-hand the semantic relationship of genes using an exponential and arc tan-based technique. The proposed work develops an enhanced shortest path-based measure using GO semantic relationship. The existing work presented an undeviating corridor based on an amalgam appraise of ontological match. Using GO graph and in sequence pleased are factors that improve the effectiveness of transfer functions of semantic connection of gene ontology. The semantic technique evaluates weighted paths for GO similarity measure. Other similarity measures use the shortest path in their calculation but require the specificity of a concept in hybrid measure performance of correlated genes.

Original language	English
Title of host publication	Advances in Electronics, Communication and Computing - ETAEERE 2016
Editors	Swagatam Das, Akhtar Kalam, Kalpana Sharma
Publisher	Springer Verlag
Pages	801-808
Number of pages	8
ISBN (Print)	9789811047640
DOIs	https://doi.org/10.1007/978-981-10-4765-7_83
Publication status	Published - 01-01-2018
Externally published	Yes
Event	International Conference on Emerging Trends and Advances in Electrical Engineering and Renewable Energy, ETAEERE 2016 - Majhitar, India Duration: 17-12-2016 → 18-12-2016

Publication series

Name	Lecture Notes in Electrical Engineering
Volume	443
ISSN (Print)	1876-1100
ISSN (Electronic)	1876-1119

Conference

Conference	International Conference on Emerging Trends and Advances in Electrical Engineering and Renewable Energy, ETAEERE 2016
Country/Territory	India
City	Majhitar
Period	17-12-16 → 18-12-16

All Science Journal Classification (ASJC) codes

Industrial and Manufacturing Engineering

Access to Document

10.1007/978-981-10-4765-7_83

Cite this

Vengatesan, K., Mahajan, S. B., Sanjeevikumar, P., Kulkarni, R. M., & Moin, S. (2018). Similarity measurement of gene using arc tan function in gene ontology. In S. Das, A. Kalam, & K. Sharma (Eds.), Advances in Electronics, Communication and Computing - ETAEERE 2016 (pp. 801-808). (Lecture Notes in Electrical Engineering; Vol. 443). Springer Verlag. https://doi.org/10.1007/978-981-10-4765-7_83

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author = "K. Vengatesan and Mahajan, {S. B.} and P. Sanjeevikumar and Kulkarni, {R. M.} and Sana Moin",

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Vengatesan, K, Mahajan, SB, Sanjeevikumar, P, Kulkarni, RM & Moin, S 2018, Similarity measurement of gene using arc tan function in gene ontology. in S Das, A Kalam & K Sharma (eds), Advances in Electronics, Communication and Computing - ETAEERE 2016. Lecture Notes in Electrical Engineering, vol. 443, Springer Verlag, pp. 801-808, International Conference on Emerging Trends and Advances in Electrical Engineering and Renewable Energy, ETAEERE 2016, Majhitar, India, 17-12-16. https://doi.org/10.1007/978-981-10-4765-7_83

Similarity measurement of gene using arc tan function in gene ontology. / Vengatesan, K.; Mahajan, S. B.; Sanjeevikumar, P. et al.
Advances in Electronics, Communication and Computing - ETAEERE 2016. ed. / Swagatam Das; Akhtar Kalam; Kalpana Sharma. Springer Verlag, 2018. p. 801-808 (Lecture Notes in Electrical Engineering; Vol. 443).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

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Similarity measurement of gene using arc tan function in gene ontology

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