TY - GEN
T1 - Skin Lesion Classification Using Feature Extraction and Ensemble Machine Learning Techniques
AU - Karnik, Arnav Sanjay
AU - Nair, Nikhil
AU - Dugar, Arham
AU - Narendra, V. G.
N1 - Publisher Copyright:
© 2025 IEEE.
PY - 2025
Y1 - 2025
N2 - This study explores a feature-engineering approach for classifying skin lesions as benign or malignant. Many other approaches regarding feature extraction can be applied: color, texture, shape, Gabor filters, Histogram of Oriented Gradients (HOG), edge density, fractal dimension, wavelet analysis, and entropy. It then gives a computationally efficient alternative instead of deep learning models. A soft-voting approach based on an ensemble of machine learning classifiers: SVM, MLP, and Random Forest is proposed. The accuracy of the classification task is significantly improved through the soft-voting approach.
AB - This study explores a feature-engineering approach for classifying skin lesions as benign or malignant. Many other approaches regarding feature extraction can be applied: color, texture, shape, Gabor filters, Histogram of Oriented Gradients (HOG), edge density, fractal dimension, wavelet analysis, and entropy. It then gives a computationally efficient alternative instead of deep learning models. A soft-voting approach based on an ensemble of machine learning classifiers: SVM, MLP, and Random Forest is proposed. The accuracy of the classification task is significantly improved through the soft-voting approach.
UR - https://www.scopus.com/pages/publications/105004804922
UR - https://www.scopus.com/pages/publications/105004804922#tab=citedBy
U2 - 10.1109/ICMLAS64557.2025.10968607
DO - 10.1109/ICMLAS64557.2025.10968607
M3 - Conference contribution
AN - SCOPUS:105004804922
T3 - 2nd International Conference on Machine Learning and Autonomous Systems, ICMLAS 2025 - Proceedings
SP - 25
EP - 33
BT - 2nd International Conference on Machine Learning and Autonomous Systems, ICMLAS 2025 - Proceedings
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2nd International Conference on Machine Learning and Autonomous Systems, ICMLAS 2025
Y2 - 10 March 2025 through 12 March 2025
ER -